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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]

Results 81-100 of 115 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
8120-Nov-2002Oxidation study of rf sputtered amorphous and polycrstalline silicon germanium filmsLeoy, C.C.; Kan, E.W.H.; Arianto, J.; Choi, W.K. ; Wee, A.T.S. ; Liu, Y.J. 
821-Jul-2003Physical and electrical characterization of HfO2 metal-insulator-metal capacitors for Si analog circuit applicationsHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
832002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
841-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
8520-Oct-2001Raman and photoluminescence characterization of Ge nanocrystals in co-sputtered Ge + SiO2 systemChoi, W.K ; Ng, V. ; Ho, Y.W; Ng, S.P; Chen, T.B; Yu, M.B; Rusli; Yoon, S.F; Cheong, B.A; Chen, G.L
86Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
8715-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
8815-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
89Nov-2001Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin filmsNatarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L. 
9015-Feb-2002Rapid thermal oxidation of radio frequency sputtered polycrystalline silicon germanium filmsChoi, W.K. ; Natarajan, A.; Bera, L.K. ; Wee, A.T.S. ; Liu, Y.J. 
912001RHEED and XPS studies of the decomposition of silicon dioxide by the bombardment of metal ionsWang, S.J. ; Ong, C.K. ; Xu, S.Y. ; Chen, P. ; Chai, J.W.; Tjiu, W.C.; Pan, J.S.; Huan, A.C.H.; Feng, W.; Lim, J.S.; Yoo, W.J. ; Choi, W.K. 
924-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
93Dec-2001Spectroscopic ellipsometry and electrical studies of as-grown and rapid thermal oxidized Si1-x-yGexCy filmsChoi, W.K. ; Feng, W.; Bera, L.K. ; Yang, C.Y.; Mi, J.
94Mar-2004Stability and composition of Ni-germanosilicided Si 1-xGe x filmsPey, K.L.; Chattopadhyay, S.; Choi, W.K. ; Miron, Y.; Fitzgerald, E.A.; Antoniadis, D.A.; Osipowicz, T. 
952006Stress development of germanium nanocrystals in silicon oxide matrixChoi, W.K. ; Chew, H.G.; Zheng, F.; Chim, W.K.; Foo, Y.L.; Fitzgerald, E.A.
9626-Jun-2008Stress tuning of Ge nanocrystals embedded in dielectricsZheng, F.; Choi, W.K. ; Lin, F.; Tripathy, S.; Zhang, J.X. 
972001Structural and electrical characterizations of oxynitride films on solid phase epitaxially grown silicon carbideBera, L.K. ; Choi, W.K. ; McNeill, D.; Ray, S.K.; Chatterjee, S.; Maiti, C.K.
98Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. 
991-Jan-2000Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor depositionChoi, W.K. ; Chen, J.H. ; Bera, L.K. ; Feng, W.; Pey, K.L. ; Mi, J.; Yang, C.Y.; Ramam, A. ; Chua, S.J. ; Pan, J.S. ; Wee, A.T.S. ; Liu, R. 
1001-Jun-2000Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy filmsChoi, W.K. ; Bera, L.K. ; Chen, J.H. ; Feng, W.; Pey, K.L. ; Yoong, H.; Mi, J.; Zhang, F.; Yang, C.Y.