Full Name
Ong Chong Kim
(not current staff)
C.K. Ong
Ong, Chong Kim
Ong, C.-K.
Ong, C.K.
Ong, C.
Main Affiliation

Results 1-20 of 504 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
17-Jun-2006A biphasic parameter estimation method for quantitative analysis of dynamic renal scintigraphic dataKoh, T.S.; Zhang, J.L.; Ong, C.K. ; Shuter, B. 
22009A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line methodChen, X.; Ma, Y. ; Xu, F. ; Wang, P. ; Ong, C.K. 
3Feb-1995A comparative study of the pressure-induced structural changes in YBa2Cu4O8 and YBa2Cu3O7-xZhang, X. ; Yip, K.W.; Ong, C.K. 
4Aug-2004A hybrid model to calculate the magnetization of nanostructured permanent magnetic materialsZhao, G.P. ; Lim, H.S. ; Feng, Y.P. ; Ong, C.K. 
51993A Monte Carlo model for trapped charge distribution in electron-irradiated α-quartzOh, K.H. ; Ong, C.K. ; Tan, B.T.G. ; Le Gressus, G.
61998A novel approach for doping impurity in thin film insitu by dual-beam pulsed-laser depositionOng, C.K. ; Xu, S.Y. ; Zhou, W.Z.
72009A novel microwave ferroelectric varactor with hybrid coplanar and parallel plate structureWang, P. ; Ong, C.K. 
81994A novel scanning electron microscope method for the investigation of charge trapping in insulatorsGong, H. ; Ong, C.K. 
92009A novel structure for dc bias on varactors in composite right/left-handed transmission lines phase shifter using Ba0.25Sr 0.75TiO3 thin filmZhang, X.-Y. ; Wang, P. ; Sheng, S.; Ma, Y. ; Xu, F. ; Ong, C.K. 
10Sep-1996A resonant cavity for high-accuracy measurement of microwave dielectric propertiesChen, L. ; Ong, C.K. ; Tan, B.T.G. 
1129-Sep-1997A scaling law for ac susceptibility of an YBa2Cu3O film in a perpendicular ac fieldHan, G.C. ; Ong, C.K. ; Xu, S.Y. ; Li, H.P. 
121-May-1996A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H. 
1310-Apr-1998AC susceptibility of (Bi,Pb)2Sr2Ca2Cu3Oy/Ag tape in perpendicular ac fieldsHan, G.C. ; Ong, C.K. ; Li, H.P. 
142000ac susceptibility of superconductors with geometric barrierQin, M.J. ; Ong, C.K. 
15Oct-2007Achieve p-type conduction in N-doped and (Al,N)-codoped ZnO thin films by oxidative annealing zinc nitride precursorsLiu, Z.W. ; Yeo, S.W.; Ong, C.K. 
1610-Feb-1994Adatom-dimer interaction on the Si(001)-2 × 1 surfaceToh, C.P.; Ong, C.K. 
171990Adsorption geometry of potassium on a Si(100) 2×1 surfaceOng, C.K. 
1814-Mar-2005Al2O3-incorporation effect on the band structure of Ba0.5Sr0.5TiO3 thin filmsZheng, Y.B.; Wang, S.J.; Huan, A.C.H. ; Tan, C.Y. ; Yan, L. ; Ong, C.K. 
19Jul-2003Amorphous (CeO2)0.67(Al2O3)0.33 high-k gate dielectric thin films on siliconYan, L. ; Kong, L.B. ; Li, Q.; Ong, C.K. 
20Sep-2003Amplification of evanescent waves in a lossy left-handed material slabRao, X.S. ; Ong, C.K.