1. ScholarBank@NUS

Gong Hao

rp01924

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Results 1-20 of 226 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
121-Mar-2012A high energy density asymmetric supercapacitor from nano-architectured Ni(OH) 2/Carbon nanotube electrodesTang, Z. ; Tang, C.-H.; Gong, H. 
21-Jan-2011A molecular quantum wire of linear carbon chains encapsulated within single-walled carbon nanotube (Cn@SWNT)Lim, S.H.; Lin, J.; Widjaja, E.; Poh, C.K.; Luo, Z.; Gao, P.Q.; Shen, Z.; Zhang, Q.; Gong, H. ; Feng, Y. 
31996A multi-technique study of the surface preparation of InSb substrate and subsequently grown CdTe films by molecular beam epitaxyFeng, Z.C. ; Gong, H. ; Choyke, W.J.; Doyle, N.J.; Farrow, R.F.C.
41994A novel scanning electron microscope method for the investigation of charge trapping in insulatorsGong, H. ; Ong, C.K. 
51-Aug-2003A room temperature indium tin oxide/quartz crystal microbalance gas sensor for nitric oxideHu, J.; Zhu, F.; Zhang, J.; Gong, H. 
62005A study of conduction in the transition zone between homologous and ZnO-rich regions in the In 2 O 3 -ZnO systemKumar, B. ; Gong, H. ; Akkipeddi, R.
72013A study on dramatically enhanced capacitance of graphene-decorated hierarchically porous nickelian heterogenite for energy storage applicationTang, C.; Yin, X.; Gong, H. 
81-May-1996A time-resolved current method for the investigation of charging ability of insulators under electron beam irradiationSong, Z.G.; Ong, C.K. ; Gong, H. 
930-Aug-2010Abrupt resistivity decrease and other unexpected phenomena in a doped amorphous ternary metal oxideSun, J.; Gong, H. 
10Sep-2000Analysis of triple Co alloy layer magnetic thin films with different bias configurationJin, D.; Wang, J.P.; Gong, H. 
113-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
12Jul-2001Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuumsLiu, L. ; Wang, Y. ; Gong, H. 
1320-Oct-2001Annealing effects of tantalum thin films sputtered on [001] silicon substrateLiu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R. 
1420-Jan-2002Annealing effects on contact properties of Aluminum doped Zinc Oxide thin filmsLow, K.B.; Gong, H. ; Chor, E.F. 
152007Annealing effects on electrical and optical properties of ZnO thin-film samples deposited by radio frequency-magnetron sputtering on GaAs (001) substratesLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. ; Xiang, N. 
162009Annealing effects on ZnO/NiSi contactWei, R.; Gong, H. 
171998Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurementCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
18Jan-1996Backscattering factor for KLL Auger yield from film-substrate systemsLee, C.L. ; Kong, K.Y.; Gong, H. ; Ong, C.K. 
191997Breakdown of reoxidized nitrided oxide (ONO) in Flash memory devices upon current stressingCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.
201-Oct-2010Capacitance decay of nanoporous nickel hydroxideHu, G. ; Li, C.; Gong, H.