Wang Yue

Collaboration Map View Statistics Email Alert RSS Feed

Full Name

Wang Yue

(not current staff)

Variants

Wang, Y.
WANG, YUE
Yue, W.

Main Affiliation

MATERIALS SCIENCE

Faculty

SCIENCE
FAC OF SCIENCE

maswangy@nus.edu.sg

Results 1-10 of 10 (Search time: 0.004 seconds).

Refman EndNote Bibtex RefWorks Excel CSV PDF Send via email

	Issue Date	Title	Author(s)
1	Jul-2001	Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuums	Liu, L. ; Wang, Y. ; Gong, H.
2	20-Oct-2001	Annealing effects of tantalum thin films sputtered on [001] silicon substrate	Liu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R.
3	20-Jan-2002	Crystal structure and properties of CU-Al-O thin films	Wang, Y. ; Gong, H. ; Liu, L.
4	Sep-2000	Effect of temperature on electrochemical behavior for Cu-Al-O coatings prepared by CVD	Yizhong, H.; Yue, W. ; Blackwood, D.J.
5	Nov-2000	High-conductivity p-type transparent copper aluminum oxide film prepared by plasma-enhanced MOCVD	Wang, Y. ; Gong, H.
6	26-Jun-2000	Nanocrystalline p-type transparent Cu-Al-O semiconductor prepared by chemical-vapor deposition with Cu(acac)2 and Al(acac)3 precursors	Gong, H. ; Wang, Y. ; Luo, Y.
7	22-Aug-2001	Optical and electrical properties of p-type transparent conducting Cu-Al-O thin films prepared by plasma enhanced chemical vapor deposition	Wang, Y. ; Gong, H. ; Zhu, F.; Liu, L. ; Huang, L. ; Huan, A.C.H.
8	27-Mar-2003	P-type transparent copper-aluminum-oxide semiconductor	GONG, HAO ; WANG, YUE ; HUANG, LEI
9	24-Feb-2004	P-type transparent copper-aluminum-oxide semiconductor	GONG, HAO ; WANG, YUE ; HUANG, LEI
10	20-Jan-2002	Sims depth profiling analysis of Cu/Ta/SiO2 interfacial diffusion at different annealing temperature	Liu, L. ; Gong, H. ; Wang, Y. ; Wee, A.T.S. ; Liu, R.