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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Results 61-80 of 232 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
612007Effects of substrate on the structure and orientation of ZnO thin film grown by rf-magnetron sputteringLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. ; Xiang, N. 
622000Effects of surface smoothness and deposition temperature of floating gates in flash memory devices to oxide/nitride/oxide interpoly dielectric breakdownCha, C.L.; Chor, E.F. ; Gong, H. ; Chan, L.
632015Effects of triethanolamine on the morphology and phase of chemically deposited tin sulfideDu M.; Yin X. ; Gong H. 
64Oct-2008Efficient bulk heterojunction solar cells from regio-regular- poly(3,3‴-didodecyl quaterthiophene)/PC70BM blendsVemulamada, P.; Hao, G. ; Kietzke, T.; Sellinger, A.
651-Aug-2001Electrical characterization and metallurgical analysis of Pd-containing multilayer contacts on GaNChor, E.F. ; Zhang, D.; Gong, H. ; Chen, G.L.; Liew, T.Y.F.
66Mar-2000Electrical characterization, metallurgical investigation, and thermal stability studies of (Pd, Ti, Au)-based ohmic contactsChor, E.F. ; Zhang, D.; Gong, H. ; Chong, W.K.; Ong, S.Y.
67Feb-2005Electronic properties of barium chalcogenides from first-principles calculations: Tailoring wide-band-gap II-VI semiconductorsLin, G.Q. ; Gong, H. ; Wu, P.
6826-Jun-2001Embedded polysilicon gate MOSFETCHAN, LAP; CHA, CHER LIANG; CHOR, ENG FONG ; HAO, GONG ; LEE, TECK KOON
692009Enhanced field emission from Argon plasma-treated ultra-sharp α-Fe 2O 3 nanoflakesZheng, Z.; Liao, L.; Yan, B.; Zhang, J.X. ; Gong, H. ; Shen, Z.X.; Yu, T.
7018-Jun-2012Enhancement of bandgap emission of Pt-capped MgZnO films: Important role of light extraction versus exciton-plasmon couplingYang, W.F. ; Xie, Y.N.; Liao, R.Y.; Sun, J.; Wu, Z.Y.; Wong, L.M.; Wang, S.J.; Wang, C.F.; Lee, A.Y.S.; Gong, H. 
711999Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoidCha, C.-L.; Tee, K.-C.; Chor, E.-F. ; Gong, H. ; Prasad, K.; Bourdillon, A.J. ; See, A. ; Chan, L.; Lee, M.M.-O.
728-Jul-2011Epitaxial growth of branched α-Fe2O3/SnO 2 nano-heterostructures with improved lithium-ion battery performanceZhou, W.; Cheng, C.; Liu, J.; Tay, Y.Y.; Jiang, J.; Jia, X.; Zhang, J. ; Gong, H. ; Hng, H.H.; Yu, T.; Fan, H.J.
73Sep-2002Evaluation of commercial electroless nickel chemicals for a low cost wafer bumping processLu, H.; Kang, C.L.; Wong, S.C.K.; Gong, H. 
741999Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damageCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Dong, Z.; Chan, L.
751-Sep-1999Evaluation of silicon nitride and silicon carbide as efficient polysilicon grain-growth inhibitorsCha, C.L.; Chor, E.F. ; Jia, Y.M.; Bourdillon, A.J. ; Gong, H. ; Pan, J.S.; Zhang, A.Q.; Tang, S.K.; Boothroyd, C.B.
761998Evaluation of the dielectric breakdown of reoxidized nitrided oxide (ONO) in flash memory devices using constant current-stressing techniqueCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
771-Jun-2004Evidence of nitric-oxide-induced surface band bending of indium tin oxideHu, J.; Pan, J.; Zhu, F.; Gong, H. 
781-Feb-2010Evolution of resonant Raman scattering spectra of ZnO crystallites upon post-growth thermal annealingLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. 
79Jul-2012Exploration of the active center structure of nitrogen-doped graphene-based catalysts for oxygen reduction reactionLai, L.; Potts, J.R.; Zhan, D.; Wang, L.; Poh, C.K.; Tang, C.; Gong, H. ; Shen, Z.; Lin, J.; Ruoff, R.S.
801-Jun-2004FePt and Fe nanocomposite by annealing self-assembled FePt nanoparticlesLu, M.H. ; Song, T.; Zhou, T.J.; Wang, J.P.; Piramanayagam, S.N. ; Ma, W.W.; Gong, H.