Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1719268
Title: Evidence of nitric-oxide-induced surface band bending of indium tin oxide
Authors: Hu, J.
Pan, J.
Zhu, F.
Gong, H. 
Issue Date: 1-Jun-2004
Citation: Hu, J., Pan, J., Zhu, F., Gong, H. (2004-06-01). Evidence of nitric-oxide-induced surface band bending of indium tin oxide. Journal of Applied Physics 95 (11 I) : 6273-6276. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1719268
Abstract: The surface electronic properties of nitric oxide (NO)-treated indium tin oxide (ITO) were examined in situ by a four-point probe and x-ray photoelectron spectroscopy (XPS). It was found that the NO adsorption induced an increase in ITO sheet resistance. A 15 nm thick ITO film was deposited on glass substrate at room temperature by radio frequency magnetron sputtering. XPS analysis shows that molecularly-adsorbed NO resulted a 0.2 eV shift in its VBM edge to a low binding energy.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/107033
ISSN: 00218979
DOI: 10.1063/1.1719268
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

15
checked on Nov 23, 2020

WEB OF SCIENCETM
Citations

13
checked on Nov 23, 2020

Page view(s)

68
checked on Nov 21, 2020

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.