Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
 
 
Email
msegongh@nus.edu.sg
 

Results 21-40 of 214 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
211997Breakdown of reoxidized nitrided oxide (ONO) in Flash memory devices upon current stressingCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.
221-Oct-2010Capacitance decay of nanoporous nickel hydroxideHu, G. ; Li, C.; Gong, H. 
23Oct-2001Characterisation of high temperature corrosion products on FeAl intermetallics by XPSXu, C.-H.; Gao, W.; Hyland, M.; Gong, H. 
241993Charge trapping on different cuts of a single-crystalline α-SiO 2Gong, H. ; Le Gressus, C.; Oh, K.H. ; Ding, X.Z.; Ong, C.K. ; Tan, B.T.G. 
25Dec-1995Charging of deformed semicrystalline polymers observed with a scanning electron microscopeGong, H. ; Chooi, K.M.; Ong, C.K. 
262016Chemical insights into the roles of nanowire cores on the growth and supercapacitor performances of Ni-Co-O/Ni(OH)2 core/shell electrodesYin, X ; Tang, C ; Zhang, L ; Yu, Z.G; Gong, H 
271994Classical electron trajectory in scanning electron microscope mirror image methodChen, H.; Gong, H. ; Ong, C.K. 
2810-May-2011Co3O4 nanowire@MnO2 ultrathin nanosheet core/shell arrays: A new class of high-performance pseudocapacitive materialsLiu, J.; Jiang, J.; Cheng, C.; Li, H.; Zhang, J. ; Gong, H. ; Fan, H.J.
292013Cobalt monoxide-doped porous graphitic carbon microspheres for supercapacitor applicationYang, Z.-C.; Tang, C.-H.; Zhang, Y. ; Gong, H. ; Li, X.; Wang, J. 
1020-Aug-2012Cobalt-mediated crystallographic etching of graphite from defectsWang, R.; Wang, J.; Gong, H. ; Luo, Z.; Zhan, D.; Shen, Z.; Thong, J.T.L. 
1115-Apr-2012Conductivity mechanism of nanosized silver layer embedded in indium zinc oxideSun, J.; Lai, W.S.; Gong, H. 
121997Constant current-stress induced breakdown of reoxidized nitrided oxide (ONO) in Flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
132006Control of p - and n -type conductivities in P doped ZnO thin films by using radio-frequency sputteringYu, Z.G.; Wu, P.; Gong, H. 
14Sep-1994Copper as an electron trap in GaAs0.6P0.4Tan, H.S. ; Han, M.K. ; Hu, P.Y.; Zheng, J.H.; Ng, S.C. ; Gong, H. 
15May-2001Correspondence: Effects of deliberate copper contamination from the plating solution on the electrical characteristics of MOSFETsTee, K.C.; Prasad, K.; Lee, C.S.; Gong, H. ; Cha, C.L.; Chan, L.; See, A.K.
1620-Jan-2002Crystal growth of Al-doped ZnO films under different sputtering conditionsGoh, E.G.; Gong, H. 
1720-Jan-2002Crystal structure and gas sensing properties of Cu-doped zinc oxideOng, C.H.; Wang, J.H.; Gong, H. ; Chan, H.S.O. 
1820-Jan-2002Crystal structure and properties of CU-Al-O thin filmsWang, Y. ; Gong, H. ; Liu, L. 
1920-Jan-2002Crystallization and interfacial processes Proceeding of International Conference on Materials for Advanced Technologies 2001: PrefaceLiu, X.Y. ; Liu, X.Y.; Gong, H. ; Chen, B.-H. 
2020-Jan-2002Crystallization and optoelectronic properties of indium-Zinc-Oxide thin films annealed in argon and vacuumChoy, S.F.; Gong, H. ; Zhu, F.