Full Name
THONG THIAM LEONG,JOHN
Variants
THONG, JOHN
Thong, D.
Thong, J.
Thong, T.L.J.
Thong, Thiam Leong John
John, T.T.L.
Thong, J.T.L.
Thong, J.T.-L.
THONG, THIAM LEONG
 
 
 
Email
elehead@nus.edu.sg
 
Other emails
 

Results 1-20 of 132 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
1Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
2Mar-1998A portable scanning electron microscope column design based on the use of permanent magnetsKhursheed, A. ; Phang, J.C. ; Thong, J.T.L. 
3Nov-1997A robust focusing and astigmatism correction method for the scanning electron microscopeOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
4Jun-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing methodOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
5Aug-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved techniqueOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
6Jan-2003Add-on transmission attachments for the scanning electron microscopeKhursheed, A. ; Karuppiah, N. ; Osterberg, M. ; Thong, J.T.L. 
710-May-2011An electrically tuned solid-state thermal memory based on metal-insulator transition of single-crystalline VO2 nanobeamsXie, R. ; Bui, C.T.; Varghese, B. ; Zhang, Q.; Sow, C.H. ; Li, B. ; Thong, J.T.L. 
81999Automatic DRAM cell location in the SEMThong, J.T.L. ; Zhu, Y. ; Phang, J.C.H. 
92000Automatic IC Die Positioning in the SEMTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
102002Automatic integrated circuit die positioning in the scanning electron microscopeTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
1118-Oct-2010Capturing a DNA duplex under near-physiological conditionsZhang, H.; Xu, W.; Liu, X. ; Stellacci, F.; Thong, J.T.L. 
121-Dec-1998Characterisation of pyramid formation arising from the TMAH etching of siliconChoi, W.K. ; Thong, J.T.L. ; Luo, P.; Tan, C.M.; Chua, T.H.; Bai, Y. 
132006Characteristics of single metallic nanowire growth via a field-emission induced processOon, C.H.; Khong, S.H. ; Boothroyd, C.B.; Thong, J.T.L. 
141995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
151997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
164-Dec-2006Co-synthesis of ZnO-CuO nanostructures by directly heating brass in airZhu, Y. ; Sow, C.-H. ; Yu, T.; Zhao, Q.; Li, P.; Shen, Z.; Yu, D.; Thong, J.T.-L. 
1720-Aug-2012Cobalt-mediated crystallographic etching of graphite from defectsWang, R.; Wang, J.; Gong, H. ; Luo, Z.; Zhan, D.; Shen, Z.; Thong, J.T.L. 
18Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
192002Connection of nanostructures using nanowires grown by a self-field emission processThong, J.T.L. ; Oon, C.H.; You, G.F.; Yeong, K.S.
20Feb-2014Control of surface morphology and crystal structure of silicon nanowires and their coherent phonon transport characteristicsLee, S.-Y.; Kim, G.-S.; Lim, J.; Han, S.; Li, B. ; Thong, J.T.L. ; Yoon, Y.-G.; Lee, S.-K.