Full Name
PHANG C H,JACOB
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
 
 
Email
elejpch@nus.edu.sg
 

Results 1-20 of 170 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1Mar-1986A comparative study of extraction methods for solar cell model parametersChan, D.S.H. ; Phillips, J.R.; Phang, J.C.H. 
2Jun-2013A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscopeChen, R.; Agarwal, K. ; Sheppard, C.J.R.; Phang, J.C.H. ; Chen, X. 
31994A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scanOng, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
42007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
5Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
6Mar-1998A portable scanning electron microscope column design based on the use of permanent magnetsKhursheed, A. ; Phang, J.C. ; Thong, J.T.L. 
7Jul-1986A review of curve fitting error criteria for solar cell I-V characteristicsPhang, J.C.H. ; Chan, D.S.H. 
82004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
92005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
10Nov-1997A robust focusing and astigmatism correction method for the scanning electron microscopeOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
11Jun-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing methodOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
12Aug-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved techniqueOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
13Sep-1993A simulation model for electron irradiation induced specimen charging in a scanning electron microscopeChan, D.S.H. ; Sim, K.S. ; Phang, J.C.H. ; Balk, L.J.; Uchikawa, Y.; Hasselbach, F.; Dinnis, A.R.
142009Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion MicroscopyTiedemann, A.-K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
15Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
161997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
172005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
18Sep-2001Analysis of high-power devices using proton beam induced charge microscopyZmeck, M.; Phang, J. ; Bettiol, A. ; Osipowicz, T. ; Watt, F. ; Balk, L.; Niedernostheide, F.-J.; Schulze, H.-J.; Falck, E.; Barthelmess, R.
192005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
20Feb-1987ANALYTICAL METHODS FOR THE EXTRACTION OF SOLAR-CELL SINGLE- AND DOUBLE-DIODE MODEL PARAMETERS FROM I-V CHARACTERISTICS.Chan, Daniel S.H. ; Phang, Jacob C.H.