Full Name
TAO JING MEI
Variants
TAO, JING MEI
Tao, J.M.
 
 
 

Publications

Results 1-11 of 11 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
11997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
2Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
37-Sep-1997Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopyChim, W.K. ; Chan, D.S.H. ; Tao, J.M. ; Lou, C.L.; Leang, S.E.; Teow, C.K.
41996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
51996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
61999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
71999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
83-Mar-1998Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingCHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU 
91995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
101995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1114-May-1996Spectroscopic observations of photon emissions in n-MOSFETs in the saturation regionTao, J.M. ; Chan, D.S.H. ; Chim, W.K.