Full Name
Wong Wai Kin
Variants
Wong, W.-K.
KIN, WONG WAI
Wong, W.K.
Wong, W.
 
 
 

Publications

Results 1-20 of 32 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1200712.9MHz Lame-mode differential SOI bulk resonatorsKhine, L.; Palaniapan, M. ; Wong, W.-K. 
220076MHz bulk-mode resonator-with Q values exceeding one millionKhine, L.; Palaniapan, M. ; Wong, W.-K. 
3Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
42009Acoustic phonon characterisation of fixed-fixed beam MEMS switchAnnamalai, M.; Palaniapan, M. ; Wong, W.-K. 
52006Carbon nanostructures as interconnect and interface materialsDe Asis, E.; Ngo, Q.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
62006Carbon nanotube interconnects in electrical and biological systemsNgo, Q.; De Asis, E.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
72007Carbon-based nanostructures as interconnects in electrical and biological systemsDe Asis, E.; Ngo, Q.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
82008Characterization of SOI Lamé-mode square resonatorsKhine, L.; Palaniapan, M. ; Shao, L.; Wong, W.-K. 
91995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
101997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
11Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
122001Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscopeThong, J.T.L. ; Wong, W.K. ; Zainal, A.
13Nov-2004Electron beam stimulated field-emission from single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Yieh, E.; Fabian Pease, R.; Dai, H.
14Nov-2004Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesWong, W.K. ; Rau, E.I.; Thong, J.T.L. 
151-Sep-1997Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
16Jan-1998Factors governing the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
171995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
181995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
1914-May-2006In situ observation of localized metallic nanocrystal growth on carbon nanotube templates in a scanning electron microscopeWong, W.-K. ; Lim, S.-H.; Thong, J.T.L. 
2020-Jul-2007In-plane motion characterization of MEMS resonators using stroboscopic scanning electron microscopyWong, C.-L.; Wong, W.-K.