1. ScholarBank@NUS

Wong Wai Kin

rp08362

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Wong Wai Kin
(not current staff)
Variants
Wong, W.-K.
KIN, WONG WAI
Wong, W.K.
Wong, W.
 
Main Affiliation
 
Faculty
 
Email
elewwk@nus.edu.sg
 
Other emails
 

Publications

Results 1-15 of 15 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
22009Acoustic phonon characterisation of fixed-fixed beam MEMS switchAnnamalai, M.; Palaniapan, M. ; Wong, W.-K. 
3Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
42001Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscopeThong, J.T.L. ; Wong, W.K. ; Zainal, A.
5Nov-2004Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesWong, W.K. ; Rau, E.I.; Thong, J.T.L. 
61-Sep-1997Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
7Jan-1998Factors governing the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
814-May-2006In situ observation of localized metallic nanocrystal growth on carbon nanotube templates in a scanning electron microscopeWong, W.-K. ; Lim, S.-H.; Thong, J.T.L. 
920-Jul-2007In-plane motion characterization of MEMS resonators using stroboscopic scanning electron microscopyWong, C.-L.; Wong, W.-K. 
102008Multiwall carbon nanotube resonator for ultra-sensitive mass detectionWu, W. ; Palaniapan, M. ; Wong, W.-K. 
11Jul-2006Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubesWong, W.K. ; Nojeh, A.; Pease, R.F.W.
122006Phonon-mediated characterization of microelectromechanical resonatorsWong, W.-K. ; Palaniapan, M. 
132001Reduction of charging effects using vector scanning in the scanning electron microscopeThong, J.T.L. ; Lee, K.W.; Wong, W.K. 
145-Jul-2004Scanning electron microscopy of field-emitting individual single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Baum, A.W.; Pease, R.F.; Dai, H.
152001Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscopeWong, W.K. ; Wei, Y.Z.; Phang, J.C.H. ; Thong, J.T.L.