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|Title:||Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope||Authors:||Wong, W.K.
|Issue Date:||1-Sep-1997||Citation:||Wong, W.K.,Phang, J.C.H.,Thong, J.T.L. (1997-09-01). Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope. Applied Physics Letters 71 (9) : 1270-1272. ScholarBank@NUS Repository.||Abstract:||A technique for measuring the second secondary emission crossover in insulators was developed. The method utilizes the behavior of an electrostatic mirror formed on insulating samples to estimate the current equilibrium point as well as the mirror potential. Current results show that the value of the second crossover for glass passivation obtained using this method is in general agreement with previous techniques. © 1997 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/62157||ISSN:||00036951|
|Appears in Collections:||Staff Publications|
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