Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/62157

DC Field	Value
dc.title	Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope
dc.contributor.author	Wong, W.K.
dc.contributor.author	Phang, J.C.H.
dc.contributor.author	Thong, J.T.L.
dc.date.accessioned	2014-06-17T06:48:00Z
dc.date.available	2014-06-17T06:48:00Z
dc.date.issued	1997-09-01
dc.identifier.citation	Wong, W.K.,Phang, J.C.H.,Thong, J.T.L. (1997-09-01). Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscope. Applied Physics Letters 71 (9) : 1270-1272. ScholarBank@NUS Repository.
dc.identifier.issn	00036951
dc.identifier.uri	http://scholarbank.nus.edu.sg/handle/10635/62157
dc.description.abstract	A technique for measuring the second secondary emission crossover in insulators was developed. The method utilizes the behavior of an electrostatic mirror formed on insulating samples to estimate the current equilibrium point as well as the mirror potential. Current results show that the value of the second crossover for glass passivation obtained using this method is in general agreement with previous techniques. © 1997 American Institute of Physics.
dc.source	Scopus
dc.type	Article
dc.contributor.department	ELECTRICAL ENGINEERING
dc.description.sourcetitle	Applied Physics Letters
dc.description.volume	71
dc.description.issue	9
dc.description.page	1270-1272
dc.description.coden	APPLA
dc.identifier.isiut	NOT_IN_WOS
Appears in Collections:	Staff Publications

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