Full Name
Wong Wai Kin
(not current staff)
Variants
Wong, W.-K.
KIN, WONG WAI
Wong, W.K.
Wong, W.
 
 
 
Email
elewwk@nus.edu.sg
 
Other emails
 

Publications

Results 21-31 of 31 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
212007Non-destructive functionality and reliability assessment of dynamic MEMS using acoustic phonon characterizationWong, W.-K. ; Wong, C.-L.; Palaniapan, M. ; Tay, F.E.H. 
222006Non-invasive acoustic phonon characterization of dynamic MEMSWong, W.K. ; Palaniapan, M. ; Wong, C.L.; Wang, S.R.; Tay, F.E.H. 
232005Novel acoustic techniques for microelectronic failure analysis and characterizationWong, W.K. ; Street, A.G.
24Jul-2006Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubesWong, W.K. ; Nojeh, A.; Pease, R.F.W.
252006Phonon-mediated characterization of microelectromechanical resonatorsWong, W.-K. ; Palaniapan, M. 
262001Reduction of charging effects using vector scanning in the scanning electron microscopeThong, J.T.L. ; Lee, K.W.; Wong, W.K. 
275-Jul-2004Scanning electron microscopy of field-emitting individual single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Baum, A.W.; Pease, R.F.; Dai, H.
2819-Aug-2003Selective deposition of a particle beam based on charging characteristics of a sampleKIN, WONG WAI ; PHANG, JACOB C. H. ; THONG, JOHN 
292001Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscopeWong, W.K. ; Wei, Y.Z.; Phang, J.C.H. ; Thong, J.T.L. 
301995Study of integrated circuits I-V characteristics using a fault localization systems [FLS]Quah, L.T.S.; Wong, W.K. ; Phang, J.C.H. ; Chan, D.S.H. ; Ho, P.Y.S.
31Nov-2003Transient temperature measurements of resist heating using nanothermocouplesChu, D.; Wong, W.-K. ; Goodson, K.E.; Pease, R.F.W.