Full Name
CHAN SIU HUNG,DANIEL
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
 
 
Email
elecshd@nus.edu.sg
 

Results 1-20 of 274 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11-Oct-1997A cleaning model for removal of particles due to laser-induced thermal expansion of substrate surfaceLu, Y.-F. ; Song, W.-D. ; Ye, K.-D. ; Lee, Y.-P.; Chan, D.S.H. ; Low, T.-S. 
2Mar-1986A comparative study of extraction methods for solar cell model parametersChan, D.S.H. ; Phillips, J.R.; Phang, J.C.H. 
31994A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scanOng, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
4Aug-2004A dual-metal gate integration process for CMOS with sub-1-nm EOT HfO2 by using HfN replacement gateRen, C.; Yu, H.Y. ; Kang, J.F.; Wang, X.P.; Ma, H.H.H. ; Yeo, Y.-C. ; Chan, D.S.H. ; Li, M.-F. ; Kwong, D.-L.
528-Apr-2006A dynamic random access memory based on a conjugated copolymer containing electron-donor and -acceptor moietiesLing, Q.-D. ; Song, Y.; Lim, S.-L.; Teo, E.Y.-H. ; Tan, Y.-P.; Zhu, C. ; Chan, D.S.H. ; Kwong, D.-L.; Kang, E.-T. ; Neoh, K.-G. 
6Aug-2007A flexible polymer memory deviceLi, L. ; Ling, Q.-D. ; Lim, S.-L.; Tan, Y.-P.; Zhu, C. ; Chan, D.S.H. ; Kang, E.-T. ; Neoh, K.-G. 
72007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
8Jul-1997A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junction MOSFET'sLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
9Oct-1995A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETsLeang, S.E.; Chim, W.K. ; Chan, D.S.H. 
102005A new gate dielectric HfLaO with metal gate work function tuning capability and superior NMOSFETs performanceWang, X.P.; Li, M.F. ; Chin, A. ; Zhu, C. ; Chi, R.; Yu, X.F.; Shen, C.; Du, A.Y.; Chan, D.S.H. ; Kwong, D.-L.
112008A novel floating gate engineering technique for improved data retention of flash memory devicesPu, J. ; Chan, D.S.H. ; Cho, B.J.
122007A novel hafnium carbide (HfCx) metal gate electrode for NMOS device applicationWan, S.H.; Chen, S.; Xing, P.W.; Chan, D.S.H. ; Byung, J.C. 
132004A novel surface passivation process for HfO 2 Ge MOSFETsWu, N.; Zhang, Q.; Zhu, C. ; Chan, D.S.H. ; Li, M.F. ; Balasubramanian, N.; Du, A.Y.; Chin, A.; Sin, J.K.O.; Kwong, D.-L.
14Jul-1986A review of curve fitting error criteria for solar cell I-V characteristicsPhang, J.C.H. ; Chan, D.S.H. 
152004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
162005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
17Sep-1993A simulation model for electron irradiation induced specimen charging in a scanning electron microscopeChan, D.S.H. ; Sim, K.S. ; Phang, J.C.H. ; Balk, L.J.; Uchikawa, Y.; Hasselbach, F.; Dinnis, A.R.
18Sep-2004A TaN-HfO2-Ge pMOSFET with novel SiH4 surface passivationWu, N.; Zhang, Q.; Zhu, C. ; Chan, D.S.H. ; Du, A.; Balasubramanian, N.; Li, M.F. ; Chin, A.; Sin, J.K.O.; Kwong, D.-L.
191-Nov-1998A theoretical model for laser cleaning of microparticles in a thin liquid layerLu, Y.-F. ; Zhang, Y.; Song, W.-D. ; Chan, D.S.H. 
201997A theoretical model for laser removal of particles from solid surfacesLu, Y.F. ; Song, W.D. ; Ang, B.W.; Hong, M.H. ; Chan, D.S.H. ; Low, T.S.