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Chan Siu Hung,Daniel

rp07001

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Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Results 61-80 of 269 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
61Jul-1999DC voltage-voltage method to measure the interface traps in sub-micron MOSTsJie, B.B.; Li, M.F. ; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
621996Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factorWittpahl, V.; Liu, Y.Y.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J.; Yan, K.P.
631996Design and characterisation of a single-reflection, solid-state detector with high discrimination against backscattered electrons for cathodoluminescence microscopyPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Leong, Y.K.
64Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
652006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
662007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
672007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
68May-1996Determination of substrate doping, substrate carrier lifetime and density of surface recombination centres of MOSFETs by gate-controlled-diode measurementsChen, T.P. ; Chan, D.S.H. ; Chim, W.K. 
691997Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysisOsipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
70May-1995Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configurationChan, Daniel S.H. ; Ong, Vincent K.S. ; Phang, Jacob C.H. 
711997Direct-current measurements of interface traps and oxide charges in LDD pMOSFETs with an n-well structureJie, B.B.; Li, M.F. ; Lou, C.L.; Lo, K.F.; Chim, W.K. ; Chan, D.S.H. 
727-Sep-1997Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopyChim, W.K. ; Chan, D.S.H. ; Tao, J.M. ; Lou, C.L.; Leang, S.E.; Teow, C.K.
7321-Nov-1995Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electronsCHAN, DANIEL S. H. ; LEONG, KIN ; PHANG, JACOB C. H. 
742003Dynamic NBTI of PMOS transistors and its impact on device lifetimeChen, G. ; Chuah, K.Y.; Li, M.F. ; Chan, D.S.H. ; Ang, C.H.; Zheng, J.Z.; Jin, Y.; Kwong, D.L.
75Nov-1995Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam testerSim, K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
7610-May-2004Effect of surface NH 3 anneal on the physical and electrical properties of HfO 2 films on Ge substrateWu, N.; Zhang, Q.; Zhu, C. ; Yeo, C.C.; Whang, S.J. ; Chan, D.S.H. ; Li, M.F. ; Cho, B.J. ; Chin, A.; Kwong, D.-L.; Du, A.Y.; Tung, C.H.; Balasubramanian, N.
771997Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single deviceLou, C.L.; Tan, C.B.; Chim, W.K. ; Chan, D.S.H. 
782004Effects of Annealing and Ar Ion Bombardment on the Removal of HfO 2 Gate DielectricChen, J. ; Yoo, W.J. ; Chan, D.S.H. ; Kwong, D.-L.
79Jan-2006Effects of N2, O2, and Ar plasma treatments on the removal of crystallized HfO2 filmChen, J. ; Yoo, W.J. ; Chan, D.S.H. 
802006Effects of SiO2/Si3N4 hard masks on etching properties of metal gatesHwang, W.S.; Cho, B.-J. ; Chan, D.S.H. ; Bliznetsov, V.; Yoo, W.J.