Ong Keng Sian Vincent

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Full Name

Variants

Ong, V.K.S.
Ong, Vincent K.S.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

Results 1-7 of 7 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	1994	A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan	Ong, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H.
2	1997	Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis	Osipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
3	May-1995	Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration	Chan, Daniel S.H. ; Ong, Vincent K.S. ; Phang, Jacob C.H.
4	Feb-1996	New developments in beam induced current methods for the failure analysis of VLSI circuits	Chan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F.
5	Jul-1997	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC	Osipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
6	Sep-2003	Single contact beam induced current phenomenon for microelectronic failure analysis	Phang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
7	1996	Unconnected junction contrast in ion beam induced charge microscopy	Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.