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Osipowicz, T.

rp05639

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Full Name
Osipowicz, T.
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 1-20 of 184 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
122-Jan-20032 MeV proton channeling contrast microscopy of LEO GaN thin film structuresOsipowicz, T. ; Teo, E.J. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2Mar-1998A high resolution beam scanning system for deep ion beam lithographySanchez, J.L.; Van Kan, J.A. ; Osipowicz, T. ; Springham, S.V.; Watt, F. 
3Jul-2004A Monte Carlo simulation study of channelling and dechannelling enhancement due to lattice translationsRana, M.A.; Breese, M.B.H. ; Osipowicz, T. 
4Jul-1997A PIXE micro-tomography experiment using MLEM algorithmNg, Y.K.; Orlic, I. ; Liew, S.C. ; Loh, K.K. ; Tang, S.M. ; Osipowicz, T. ; Watt, F. 
52002A study of the decomposition of GaN during annealing over a wide range of temperaturesRana, M.A.; Choi, H.W.; Breese, M.B.H. ; Osipowicz, T. ; Chua, S.J. ; Watt, F. 
613-Oct-2003A study of the material loss and other processes involved during annealing of GaN at growth temperaturesRana, M.A.; Osipowicz, T. ; Choi, H.W.; Breese, M.B.H. ; Chua, S.J. 
7Apr-2005An automatic beam focusing system for MeV protonsUdalagama, C.N.B. ; Bettiol, A.A. ; Van Kan, J.A. ; Teo, E.J. ; Breese, M.B.H. ; Osipowicz, T. ; Watt, F. 
82005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
9Sep-2001Analysis of high-power devices using proton beam induced charge microscopyZmeck, M.; Phang, J. ; Bettiol, A. ; Osipowicz, T. ; Watt, F. ; Balk, L.; Niedernostheide, F.-J.; Schulze, H.-J.; Falck, E.; Barthelmess, R.
102000Analysis of high-power devices using proton beam induced currentsZmeck, M.; Osipowicz, T. ; Watt, F. ; Niedernostheide, F.; Schulze, H.-J.; Fiege, G.B.M.; Balk, L.
11Feb-2004Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometryMangelinck, D.; Lee, P.S.; Osipowitcz, T. ; Pey, K.L.
122005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
1315-Jun-2009Angular and lateral spreading of ion beams in biomedical nuclear microscopyWhitlow, H.J.; Ren, M. ; van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
142013Angular spreading measurements using MeV ion microscopesWhitlow, H.J.; Ren, M. ; Chen, X.; Osipowicz, T. ; Van Kan, J.A. ; Watt, F. 
15Sep-2004Ba0.1Sr0.9TiO3-BaTi4O 9 composite thin films with improved microwave dielectric propertiesYan, L. ; Chen, L.F. ; Tan, C.Y. ; Ong, C.K. ; Rahman, M.A.; Osipowicz, T. 
1615-May-2002Behaviour of ionized metal plasma deposited Ta diffusion barrier between Cu and SiO2Maung Latt, K.; Park, H.S.; Li, S.; Rong, L. ; Osipowicz, T. ; Zhu, W.G.; Lee, Y.K.
17Jul-2007Channeling contrast microscopy of epitaxial lateral overgrowth of ZnO/GaN filmsZhou, H.; Pan, H. ; Chan, T.K. ; Ho, C.S.; Feng, Y. ; Chua, S.-J.; Osipowicz, T. 
182-Sep-1999Channeling contrast microscopy of GaN and InGaN thin filmsOsipowicz, T. ; Chiam, S.Y. ; Watt, F. ; Li, G.; Chua, S.J.
19Jul-2001Channeling contrast microscopy on lateral epitaxial overgrown GaNTeo, E.J. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2015-Jun-2009Characterisation of beam focus quality in biomedical nuclear microscopy: A Fourier optics approachWhitlow, H.J.; Ren, M. ; van Kan, J.A. ; Osipowicz, T. ; Watt, F.