1. ScholarBank@NUS

Osipowicz Thomas

rp05639

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 61-80 of 184 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
612005Formation and thermal stability of nickel germanide on germanium substrateZhang, Q.; Nan, W.U.; Osipowicz, T. ; Bera, L.K.; Zhu, C. 
621-Nov-2010Formation of epitaxial metastable NiGe2 thin film on Ge(100) by pulsed excimer laser annealLim, P.S.Y.; Chi, D.Z.; Lim, P.C.; Wang, X.C.; Chan, T.K. ; Osipowicz, T. ; Yeo, Y.-C. 
315-Feb-2012Formation of nanoclusters with varying Pb/Se concentration and distribution after sequential Pb + and Se + ion implantation into SiO 2Markwitz, A.; Carder, D.A.; Hopf, T.; Kennedy, J.; Chan, T.K. ; Mücklich, A.; Osipowicz, T. 
41-Apr-2002Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopyChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Zhang, Q.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
25Dec-2011Gradient inverse opal photonic crystals via spatially controlled template replication of self-assembled opalsKaruturi, S.K.; Liu, L.; Su, L.T.; Chutinan, A.; Kherani, N.P.; Chan, T.K. ; Osipowicz, T. ; Yoong Tok, A.I.
2610-May-2006Growth of high quality Er-Ge films on Ge(001) substrates by suppressing oxygen contamination during germanidation annealingLiew, S.L.; Balakrisnan, B.; Chow, S.Y.; Lai, M.Y.; Wang, W.D.; Lee, K.Y.; Ho, C.S.; Osipowicz, T. ; Chi, D.Z.
27May-2002High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structuresOsipowicz, T. ; Seng, H.L. ; Wielunski, L.S.; Tok, E.S. ; Breton, G.; Zhang, J.
8Sep-2003High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layersSeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Breese, M.B.H. ; Watt, F. ; Tok, E.S. ; Zhang, J.
9Apr-2008HRBS/channeling studies of ultra-thin ITO films on SiMalar, P. ; Chan, T.K. ; Ho, C.S.; Osipowicz, T. 
102-Sep-1999Hydrogen 3D distribution in solids by ERDA imagingYang, C. ; Teo, E.J. ; Osipowicz, T. ; Watt, F. ; Jamieson, D.; Lee, K.K.; Tomcik, B. 
111-Sep-2002Hydrogenated amorphous silicon carbide deposition using electron cyclotron resonance chemical vapor deposition under high microwave power and strong hydrogen dilutionChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
12Jul-2001IBIC analysis of high-power devicesOsipowicz, T. ; Zmeck, M.; Watt, F. ; Fiege, G.; Balk, L.; Niedernostheide, F.; Schulze, H.-J.
131998Imaging of charge collection properties of CVD diamond using high-resolution ion beam induced charge technique with protons and alpha particlesJakšić, M.; Tadić, T.; Orlić, I. ; Osipowicz, T. ; Vittone, E.; Manfredotti, C.
141-Feb-2004Improvement of dielectric loss tangent of Al2O3 doped Ba0.5Sr0.5TiO3 thin films for tunable microwave devicesChong, K.B.; Kong, L.B. ; Chen, L. ; Yan, L. ; Tan, C.Y. ; Yang, T.; Ong, C.K. ; Osipowicz, T. 
151999Indium-doped zinc oxide films prepared by simultaneous r.f. and d.c. magnetron sputteringZhang, K.; Zhu, F. ; Huan, C.H.A. ; Wee, A.T.S. ; Osipowicz, T. 
16Jan-2007InGaN multiple quantum wells grown on ELO GaN templates and the optical properties characterizationZhou, H.; Chua, S.J.; Zang, K.; Wang, L.S.; Tripathy, S.; Yakovlev, N.; Thomas, O. 
17Jun-2000Integrity of copper-tantalum nitride metallization under different ambient conditionsYap, K.P.; Gong, H. ; Dai, J.Y.; Osipowicz, T. ; Chan, L.H.; Lahiri, S.K.
18Apr-2008Interface strain study of thin Lu2O3/Si using HRBSChan, T.K. ; Darmawan, P.; Ho, C.S.; Malar, P. ; Lee, P.S.; Osipowicz, T. 
1915-Jun-2002Interfacial reactions and failure mechanism of Cu/Ta/SiO2/Si multilayer structure in thermal annealingLatt, K.M.; Lee, Y.K.; Osipowicz, T. ; Park, H.S.
202-Sep-1999Investigation of light emitting diodes using nuclear microprobesYang, C. ; Bettiol, A.; Jamieson, D.; Hua, X.; Phang, J.C.H. ; Chan, D.S.H. ; Watt, F. ; Osipowicz, T.