Full Name
SENG HWEE LENG,DEBBIE
Variants
Seng, H.L.
 
Main Affiliation
 
Faculty
 
Email
physengd@nus.edu.sg
 

Publications

Results 1-19 of 19 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
118-May-2001Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEMHo, Y.W.; Ng, V. ; Choi, W.K. ; Ng, S.P.; Osipowicz, T. ; Seng, H.L. ; Tjui, W.W.; Li, K.
2Jan-2004Characterization of thick graded Si1-xGex/Si layers grown by low energy plasma enhanced chemical vapour depositionSeng, H.L. ; Breese, M.B.H. ; Watt, F. ; Kummer, M.; Von Känel, H.
3Apr-2005Determination of local lattice tilt in Si1-xGex virtual substrate using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. ; Watt, F. 
415-Dec-2001Diffusion barrier properties of ionized metal plasma deposited tantalum nitride thin films between copper and silicon dioxideLatt, K.M.; Lee, Y.K.; Seng, H.L. ; Osipowicz, T. 
523-Aug-2004Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscopeSum, T.C. ; Bettiol, A.A. ; Seng, H.L. ; Van Kan, J.A. ; Watt, F. 
67-Mar-2002Effect of the silicon nitride passivation layer on the Cu/Ta/SiO2/Si multi-layer structureLatt, K.M.; Park, H.S.; Seng, H.L. ; Osipowicz, T. ; Lee, Y.K.; Li, S.
7May-2002High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structuresOsipowicz, T. ; Seng, H.L. ; Wielunski, L.S.; Tok, E.S. ; Breton, G.; Zhang, J.
8Sep-2003High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layersSeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Breese, M.B.H. ; Watt, F. ; Tok, E.S. ; Zhang, J.
96-Nov-2000Liquid-phase epitaxial growth of amorphous silicon during laser annealing of ultrashallow p+/n junctionsChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; Osipowicz, T. ; Seng, H.L. ; See, A.; Dai, J.-Y.
10Jul-2001Micro-RBS study of nickel silicide formationSeng, H.L. ; Osipowicz, T. ; Lee, P.S.; Mangelinck, D.; Sum, T.C. ; Watt, F. 
11Nov-2005Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. 
1222-Apr-2002Probing the SiGe virtual substrate by high-resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Tok, E.S. ; Breton, G.; Woods, N.J.; Zhang, J.
13Sep-2003Proton beam writing of passive waveguides in PMMASum, T.C. ; Bettiol, A.A. ; Seng, H.L. ; Rajta, I. ; Van Kan, J.A. ; Watt, F. 
14Nov-2001Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin filmsNatarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L. 
151-Oct-2002Study on SiNx passivated Cu/Ta/SiO2/Si multilayer structureLatt, K.M.; Park, H.S.; Seng, H.L. ; Osipowicz, T. ; Lee, Y.K.
162006The CIBA high resolution RBS facilityOsipowicz, T. ; Seng, H.L. ; Chan, T.K.; Ho, B. 
17Aug-2006The CIBA high resolution RBS facilityOsipowicz, T. ; Seng, H.L. ; Chan, T.K. ; Ho, B.
1820-Jul-2001The impact of layer thickness of IMP-deposited tantalum nitride films on integrity of Cu/TaN/SiO2/Si multilayer structureLatt, K.M.; Lee, Y.K.; Li, S.; Osipowicz, T. ; Seng, H.L. 
19Dec-2003Via resistance reduction using "cool" PVD-Ta processingSeet, C.S.; Zhang, B.C.; Yong, C.; Liew, S.L.; Li, K.; Hsia, L.C.; Seng, H.L. ; Osiposwicz, T. ; Sudijono, J.; Zeng, H.C. ; Tan, J.B.