Imaging of charge collection properties of CVD diamond using high-resolution ion beam induced charge technique with protons and alpha particles

Abstract

An ion beam of very low current focussed to a micrometer or submicrometer spot is used as a probe to test the transport properties of charge created along the path of a particular ion in a sample. This technique, called ion beam induced charge (IBIC), has been used in the research of the charge transport properties of CVD diamonds. IBIC measurements with 2 MeV protons and alpha particles give images of the sample's microcrystaline "electric" structure. Since protons and alpha particles have different ranges, charge collection efficiency images for different average sampling depths were obtained.