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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 161-180 of 184 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
161Mar-2000Sub 100 nm proton beam micromachining: theoretical calculations on resolution limitsVan Kan, J.A. ; Sum, T.C. ; Osipowicz, T. ; Watt, F. 
162May-2002Sub-micron channeling contrast microscopy on reactive ion etched deep Si microstructuresTeo, E.J. ; Alkaisi, M.; Bettiol, A.A. ; Osipowicz, T. ; Van Kan, J. ; Watt, F. ; Markwitz, A.
16331-Oct-2005Suppression of oxidation in nickel germanosilicides by Pt incorporationRahman, M.A.; Osipowicz, T. ; Pey, K.L.; Jin, L.J.; Choi, W.K.; Chi, D.Z.; Antoniadis, D.A.; Fitzgerald, E.A.; Isaacson, D.M.
164Dec-2002Surface analysis of GaN decompositionChoi, H.W.; Rana, M.A.; Chua, S.J. ; Osipowicz, T. ; Pan, J.S.
1651-Sep-1996Surface and interface studies of titanium silicide formationWee, A.T.S. ; Huan, A.C.H. ; Osipowicz, T. ; Lee, K.K.; Thian, W.H.; Tan, K.L. ; Hogan, R.
1662-Dec-1995Surface treatment by low energy metal ion irradiationWeber, T.; Verhoeven, J.; Saris, F.W.; Osipowicz, T. ; Münz, W.D.
1672014Synthesis of embedded Au nanostructures by ion irradiation: Influence of ion induced viscous flow and sputteringSingh, U.B.; Agarwal, D.C.; Khan, S.A.; Mohapatra, S.; Amekura, H.; Datta, D.P.; Kumar, A.; Choudhury, R.K.; Chan, T.K. ; Osipowicz, T. ; Avasthi, D.K.
1682006The CIBA high resolution RBS facilityOsipowicz, T. ; Seng, H.L. ; Chan, T.K.; Ho, B. 
169Aug-2006The CIBA high resolution RBS facilityOsipowicz, T. ; Seng, H.L. ; Chan, T.K. ; Ho, B.
1702-Sep-1995The effect of external fields and slit scattering on the beam spot profile of the coupled triplet systemWatt, F. ; Choo, T.F.; Lee, K.K.; Osipowicz, T. ; Orlic, I. ; Tang, S.M. 
1711-Aug-2008The fabrication of x-ray masks using proton beam writingYue, W. ; Chiam, S.-Y. ; Ren, Y.; Van Kan, J.A. ; Osipowicz, T. ; Jian, L. ; Moser, H.O. ; Watt, F. 
17220-Jul-2001The impact of layer thickness of IMP-deposited tantalum nitride films on integrity of Cu/TaN/SiO2/Si multilayer structureLatt, K.M.; Lee, Y.K.; Li, S.; Osipowicz, T. ; Seng, H.L. 
132-Sep-1995The microanalysis of individual aerosol particles using the nuclear microscopeOrlic, I. ; Osipowicz, T. ; Watt, F. ; Tang, S.M. 
14Sep-2003The National University of Singapore high energy ion nano-probe facility: Performance testsWatt, F. ; Van Kan, J.A. ; Rajta, I. ; Bettiol, A.A. ; Choo, T.F.; Breese, M.B.H. ; Osipowicz, T. 
152-Mar-1994The National University of Singapore nuclear microscope facilityWatt, F. ; Orlic, I. ; Loh, K.K. ; Sow, C.H. ; Thong, P. ; Liew, S.C. ; Osipowicz, T. ; Choo, T.F.; Tang, S.M. 
162000The use of proton microbeams for the production of microcomponentsOsipowicz, T. ; Van Kan, J.A. ; Sum, T.C. ; Sanchez, J.L.; Watt, F. 
17Jan-2004Thermal stability study of NiSi and NiSi2 thin filmsZhao, F.F.; Zheng, J.Z. ; Shen, Z.X. ; Osipowicz, T. ; Gao, W.Z.; Chan, L.H.
181999Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formationHo, C.S.; Pey, K.L. ; Tung, C.H.; Tee, K.C.; Prasad, K.; Saigal, D.; Tan, J.J.L.; Wong, H.; Lee, K.H.; Osipowicz, T. ; Chua, S.J. ; Karunasiri, R.P.G. 
192002Thickness effect on nickel silicide formation and thermal stability for ultra shallow junction CMOSZhao, F.F.; Shen, Z.X. ; Zheng, J.Z.; Gao, W.Z.; Osipowicz, T. ; Pang, C.H.; Lee, P.S.; See, A.K.
201996Unconnected junction contrast in ion beam induced charge microscopyKolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.