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|Title:||Unconnected junction contrast in ion beam induced charge microscopy||Authors:||Kolachina, S.
|Issue Date:||1996||Citation:||Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F. (1996). Unconnected junction contrast in ion beam induced charge microscopy. Applied Physics Letters 68 (4) : 532-534. ScholarBank@NUS Repository. https://doi.org/10.1063/1.116390||Abstract:||A new contrast mechanism in ion beam induced charge imaging in semiconductors is reported. Junctions not directly connected to the charge collection preamplifier were found to give rise to significant charge collection signals. Imaging with these signals is carried out, thus enabling the mapping of junctions not directly connected to the charge collection amplifier. © 1996 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/62909||ISSN:||00036951||DOI:||10.1063/1.116390|
|Appears in Collections:||Staff Publications|
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