Full Name
TEO EE JIN
Variants
Teo, E.-J.
Teo, E.J.
 
Main Affiliation
 
Faculty
 
Email
phytej@nus.edu.sg
 

Publications

Results 1-20 of 76 (Search time: 0.013 seconds).

Issue DateTitleAuthor(s)
122-Jan-20032 MeV proton channeling contrast microscopy of LEO GaN thin film structuresOsipowicz, T. ; Teo, E.J. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
2Apr-2005A progress review of proton beam writing applications in microphotonicsBettiol, A.A. ; Sum, T.C. ; Cheong, F.C. ; Sow, C.H. ; Venugopal Rao, S. ; Van Kan, J.A. ; Teo, E.J. ; Ansari, K. ; Watt, F. 
3Jul-2007A review of transmission channelling using high-demagnification microprobesBreese, M.B.H. ; Teo, E.J. ; Huang, L.
415-Jun-2009Advanced applications in microphotonics using proton beam writingBettiol, A.A. ; Chiam, S.Y. ; Teo, E.J. ; Udalagama, C. ; Chan, S.F.; Hoi, S.K. ; van Kan, J.A. ; Breese, M.B.H. ; Watt, F. 
52008An all-silicon channel waveguide fabricated using direct proton beam writingTeo, E.J. ; Bettiol, A.A. ; Breese, M.B.H. ; Yang, P.Y.; Mashanovich, G.Z.; Headley, W.R.; Reed, G.T.; Blackwood, D.J.
626-Apr-2010An all-silicon, single-mode Bragg cladding rib waveguideTeo, E.J. ; Bettiol, A.A. ; Xiong, B.; Breese, M.B.H. ; Shuvan, P.T.
7Apr-2005An automatic beam focusing system for MeV protonsUdalagama, C.N.B. ; Bettiol, A.A. ; Van Kan, J.A. ; Teo, E.J. ; Breese, M.B.H. ; Osipowicz, T. ; Watt, F. 
8Jul-2001Channeling contrast microscopy on lateral epitaxial overgrown GaNTeo, E.J. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
9Apr-2005Characterisation of 60° misfit dislocations in SiGe alloy using nuclear microscopyHuang, L.; Breese, M.B.H. ; Teo, E.J. 
10Mar-2002Characteristics of nickel-containing carbon films deposited using electron cyclotron resonance CVDHuang, Q.F.; Yoon, S.F.; Rusli; Zhang, Q.; Ahn, J.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
118-Nov-2004Controlled intensity emission from patterned porous silicon using focused proton beam irradiationTeo, E.J. ; Mangaiyarkarasi, D. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. 
122005Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiationMangaiyarkarasi, D. ; Teo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. 
131-Aug-2004Depth-resolved luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescenceTeo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.; Chua, S.J. ; Liu, Y.Y. 
14Jul-2002Deuterium-oxygen exchange on diamond (100)-A study by ERDA, RBS and TOF-SIMSLoh, K.P. ; Xie, X.N. ; Zhang, X. ; Teo, E.J. ; Osipowicz, T. ; Lai, M.Y.; Yakovlev, N.
15Jun-2001Effect of radio-frequency bias voltage on the optical and structural properties of hydrogenated amorphous silicon carbideCui, J.; Rusli; Yoon, S.F.; Teo, E.J. ; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Osipowicz, T. ; Watt, F. 
16May-2010Effects of focused MeV ion beam irradiation on the roughness of electrochemically micromachined silicon surfacesOw, Y.S. ; Azimi, S.; Breese, M.B.H. ; Teo, E.J. ; Mangaiyarkarasi, D. 
17Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
181-Mar-2001Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor depositionCui, J.; Rusli, R.; Yoon, S.F.; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
1915-Oct-2009Effects of oxide formation around core circumference of silicon-on-oxidized-porous-silicon strip waveguidesTeo, E.J. ; Xiong, B.Q.; Ow, Y.S. ; Breese, M.B.H. ; Bettiol, A.A. 
20Jul-2007Embedded photonic structures fabricated in photosensitive glass using proton beam writingBettiol, A.A. ; Udalagama, C.N.B. ; Teo, E.J. ; van Kan, J.A. ; Watt, F.