Please use this identifier to cite or link to this item:
|Title:||Angular spreading measurements using MeV ion microscopes||Authors:||Whitlow, H.J.
Van Kan, J.A.
MeV ion microscope
|Issue Date:||2013||Citation:||Whitlow, H.J., Ren, M., Chen, X., Osipowicz, T., Van Kan, J.A., Watt, F. (2013). Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 306 : 311-313. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2012.11.035||Abstract:||The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5-6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.). © 2012 Elsevier B.V. All rights reserved.||Source Title:||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms||URI:||http://scholarbank.nus.edu.sg/handle/10635/95793||ISSN:||0168583X||DOI:||10.1016/j.nimb.2012.11.035|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.