Please use this identifier to cite or link to this item:
|Title:||Angular spreading measurements using MeV ion microscopes|
Van Kan, J.A.
MeV ion microscope
|Citation:||Whitlow, H.J., Ren, M., Chen, X., Osipowicz, T., Van Kan, J.A., Watt, F. (2013). Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 306 : 311-313. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2012.11.035|
|Abstract:||The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5-6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.). © 2012 Elsevier B.V. All rights reserved.|
|Source Title:||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 12, 2019
WEB OF SCIENCETM
checked on Jan 2, 2019
checked on Jan 11, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.