Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.nimb.2012.11.035
Title: Angular spreading measurements using MeV ion microscopes
Authors: Whitlow, H.J.
Ren, M. 
Chen, X.
Osipowicz, T. 
Van Kan, J.A. 
Watt, F. 
Keywords: Angular spreading
MeV ion microscope
Multiple scattering
STIM
Issue Date: 2013
Citation: Whitlow, H.J., Ren, M., Chen, X., Osipowicz, T., Van Kan, J.A., Watt, F. (2013). Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 306 : 311-313. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2012.11.035
Abstract: The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5-6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.). © 2012 Elsevier B.V. All rights reserved.
Source Title: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
URI: http://scholarbank.nus.edu.sg/handle/10635/95793
ISSN: 0168583X
DOI: 10.1016/j.nimb.2012.11.035
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