Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.nimb.2012.11.035
DC FieldValue
dc.titleAngular spreading measurements using MeV ion microscopes
dc.contributor.authorWhitlow, H.J.
dc.contributor.authorRen, M.
dc.contributor.authorChen, X.
dc.contributor.authorOsipowicz, T.
dc.contributor.authorVan Kan, J.A.
dc.contributor.authorWatt, F.
dc.date.accessioned2014-10-16T09:15:53Z
dc.date.available2014-10-16T09:15:53Z
dc.date.issued2013
dc.identifier.citationWhitlow, H.J., Ren, M., Chen, X., Osipowicz, T., Van Kan, J.A., Watt, F. (2013). Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 306 : 311-313. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2012.11.035
dc.identifier.issn0168583X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95793
dc.description.abstractThe sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5-6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.). © 2012 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.nimb.2012.11.035
dc.sourceScopus
dc.subjectAngular spreading
dc.subjectMeV ion microscope
dc.subjectMultiple scattering
dc.subjectSTIM
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1016/j.nimb.2012.11.035
dc.description.sourcetitleNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.description.volume306
dc.description.page311-313
dc.description.codenNIMBE
dc.identifier.isiut000321085900067
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