Classical electron trajectory in scanning electron microscope mirror image method

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.357753

Title:	Classical electron trajectory in scanning electron microscope mirror image method
Authors:	Chen, H. Gong, H. Ong, C.K.
Issue Date:	1994
Citation:	Chen, H., Gong, H., Ong, C.K. (1994). Classical electron trajectory in scanning electron microscope mirror image method. Journal of Applied Physics 76 (2) : 806-809. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357753
Abstract:	A scanning electron microscope (SEM) is employed to study the charging phenomenon of polymethylmethacrylate using the mirror image method. Classical scattering theory is modified to calculate the total trapped charge Q. This theory has also been used to justify the use of a fitting procedure to calculate Q. The fitting procedure is more feasible for a SEM which does not have low accelerating voltage facility. Results from both methods are compared. Details of derivation are given.
Source Title:	Journal of Applied Physics
URI:	http://scholarbank.nus.edu.sg/handle/10635/95993
ISSN:	00218979
DOI:	10.1063/1.357753
Appears in Collections:	Staff Publications

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