Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.357753
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dc.titleClassical electron trajectory in scanning electron microscope mirror image method
dc.contributor.authorChen, H.
dc.contributor.authorGong, H.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:18:15Z
dc.date.available2014-10-16T09:18:15Z
dc.date.issued1994
dc.identifier.citationChen, H., Gong, H., Ong, C.K. (1994). Classical electron trajectory in scanning electron microscope mirror image method. Journal of Applied Physics 76 (2) : 806-809. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357753
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95993
dc.description.abstractA scanning electron microscope (SEM) is employed to study the charging phenomenon of polymethylmethacrylate using the mirror image method. Classical scattering theory is modified to calculate the total trapped charge Q. This theory has also been used to justify the use of a fitting procedure to calculate Q. The fitting procedure is more feasible for a SEM which does not have low accelerating voltage facility. Results from both methods are compared. Details of derivation are given.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.357753
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.357753
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume76
dc.description.issue2
dc.description.page806-809
dc.identifier.isiutA1994NX40000026
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