Please use this identifier to cite or link to this item:
|Title:||Classical electron trajectory in scanning electron microscope mirror image method|
|Citation:||Chen, H., Gong, H., Ong, C.K. (1994). Classical electron trajectory in scanning electron microscope mirror image method. Journal of Applied Physics 76 (2) : 806-809. ScholarBank@NUS Repository. https://doi.org/10.1063/1.357753|
|Abstract:||A scanning electron microscope (SEM) is employed to study the charging phenomenon of polymethylmethacrylate using the mirror image method. Classical scattering theory is modified to calculate the total trapped charge Q. This theory has also been used to justify the use of a fitting procedure to calculate Q. The fitting procedure is more feasible for a SEM which does not have low accelerating voltage facility. Results from both methods are compared. Details of derivation are given.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Aug 18, 2018
WEB OF SCIENCETM
checked on Jul 16, 2018
checked on Aug 3, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.