Please use this identifier to cite or link to this item:
|Title:||A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method||Authors:||Chen, X.
|Issue Date:||2009||Citation:||Chen, X., Ma, Y., Xu, F., Wang, P., Ong, C.K. (2009). A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method. Journal of Applied Physics 105 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3054181||Abstract:||In this paper, the microwave characteristics of a FeTaN lamination stack are studied with a shorted microstrip line method. The FeTaN lamination stack was fabricated by gluing 54 layers of FeTaN units with epoxy together. The FeTaN units were deposited on both sides of an 8 μm polyethylene terephthate (Mylar) film as the substrate by rf magnetron sputtering. On each side of the Mylar substrate, three 100-nm FeTaN layers are laminated with two 8 nm Al 2O3 layers. The complex permeability of FeTaN lamination stack is calculated by the scattering parameters using the shorted load transmission line model based on the quasi-transverse-electromagnetic approximation. A full wave analysis combined with an optimization process is employed to determine the accurate effective permeability values. The optimized complex permeability data can be used for the microwave filter design. © 2009 American Institute of Physics.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/116900||ISSN:||00218979||DOI:||10.1063/1.3054181|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 23, 2020
WEB OF SCIENCETM
checked on Jan 14, 2020
checked on Jan 25, 2020
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.