Please use this identifier to cite or link to this item:
|Title:||A resonant cavity for high-accuracy measurement of microwave dielectric properties||Authors:||Chen, L.
|Issue Date:||Sep-1996||Citation:||Chen, L., Ong, C.K., Tan, B.T.G. (1996-09). A resonant cavity for high-accuracy measurement of microwave dielectric properties. Measurement Science and Technology 7 (9) : 1255-1259. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/9/010||Abstract:||This paper demonstrates that, along with the change in resonant frequency, the coupling coefficient between a resonant cavity and a transmission line will be altered once a dielectric sample is inserted into the cavity. These changes affect the measurements of the Q factors, and thus cause uncertainties in the permittivity measurements of dielectric samples. An X-band TE112 mode cavity is designed to overcome the uncertainties in the permittivity measurements, with which the Q values can be measured at the same resonant frequency and the same coupling conditions before and after the introduction of a dielectric sample.||Source Title:||Measurement Science and Technology||URI:||http://scholarbank.nus.edu.sg/handle/10635/95678||ISSN:||09570233||DOI:||10.1088/0957-0233/7/9/010|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Aug 5, 2020
WEB OF SCIENCETM
checked on Jul 28, 2020
checked on Aug 1, 2020
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.