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|Title:||A resonant cavity for high-accuracy measurement of microwave dielectric properties||Authors:||Chen, L.
|Issue Date:||Sep-1996||Citation:||Chen, L., Ong, C.K., Tan, B.T.G. (1996-09). A resonant cavity for high-accuracy measurement of microwave dielectric properties. Measurement Science and Technology 7 (9) : 1255-1259. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/9/010||Abstract:||This paper demonstrates that, along with the change in resonant frequency, the coupling coefficient between a resonant cavity and a transmission line will be altered once a dielectric sample is inserted into the cavity. These changes affect the measurements of the Q factors, and thus cause uncertainties in the permittivity measurements of dielectric samples. An X-band TE112 mode cavity is designed to overcome the uncertainties in the permittivity measurements, with which the Q values can be measured at the same resonant frequency and the same coupling conditions before and after the introduction of a dielectric sample.||Source Title:||Measurement Science and Technology||URI:||http://scholarbank.nus.edu.sg/handle/10635/95678||ISSN:||09570233||DOI:||10.1088/0957-0233/7/9/010|
|Appears in Collections:||Staff Publications|
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