Please use this identifier to cite or link to this item:
https://doi.org/10.1088/0957-0233/7/9/010
DC Field | Value | |
---|---|---|
dc.title | A resonant cavity for high-accuracy measurement of microwave dielectric properties | |
dc.contributor.author | Chen, L. | |
dc.contributor.author | Ong, C.K. | |
dc.contributor.author | Tan, B.T.G. | |
dc.date.accessioned | 2014-10-16T09:14:32Z | |
dc.date.available | 2014-10-16T09:14:32Z | |
dc.date.issued | 1996-09 | |
dc.identifier.citation | Chen, L., Ong, C.K., Tan, B.T.G. (1996-09). A resonant cavity for high-accuracy measurement of microwave dielectric properties. Measurement Science and Technology 7 (9) : 1255-1259. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/9/010 | |
dc.identifier.issn | 09570233 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/95678 | |
dc.description.abstract | This paper demonstrates that, along with the change in resonant frequency, the coupling coefficient between a resonant cavity and a transmission line will be altered once a dielectric sample is inserted into the cavity. These changes affect the measurements of the Q factors, and thus cause uncertainties in the permittivity measurements of dielectric samples. An X-band TE112 mode cavity is designed to overcome the uncertainties in the permittivity measurements, with which the Q values can be measured at the same resonant frequency and the same coupling conditions before and after the introduction of a dielectric sample. | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.description.doi | 10.1088/0957-0233/7/9/010 | |
dc.description.sourcetitle | Measurement Science and Technology | |
dc.description.volume | 7 | |
dc.description.issue | 9 | |
dc.description.page | 1255-1259 | |
dc.description.coden | MSTCE | |
dc.identifier.isiut | A1996VH92200010 | |
Appears in Collections: | Staff Publications |
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