Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-0233/7/9/010
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dc.titleA resonant cavity for high-accuracy measurement of microwave dielectric properties
dc.contributor.authorChen, L.
dc.contributor.authorOng, C.K.
dc.contributor.authorTan, B.T.G.
dc.date.accessioned2014-10-16T09:14:32Z
dc.date.available2014-10-16T09:14:32Z
dc.date.issued1996-09
dc.identifier.citationChen, L., Ong, C.K., Tan, B.T.G. (1996-09). A resonant cavity for high-accuracy measurement of microwave dielectric properties. Measurement Science and Technology 7 (9) : 1255-1259. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/9/010
dc.identifier.issn09570233
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95678
dc.description.abstractThis paper demonstrates that, along with the change in resonant frequency, the coupling coefficient between a resonant cavity and a transmission line will be altered once a dielectric sample is inserted into the cavity. These changes affect the measurements of the Q factors, and thus cause uncertainties in the permittivity measurements of dielectric samples. An X-band TE112 mode cavity is designed to overcome the uncertainties in the permittivity measurements, with which the Q values can be measured at the same resonant frequency and the same coupling conditions before and after the introduction of a dielectric sample.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1088/0957-0233/7/9/010
dc.description.sourcetitleMeasurement Science and Technology
dc.description.volume7
dc.description.issue9
dc.description.page1255-1259
dc.description.codenMSTCE
dc.identifier.isiutA1996VH92200010
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