Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-0233/7/9/010
Title: A resonant cavity for high-accuracy measurement of microwave dielectric properties
Authors: Chen, L. 
Ong, C.K. 
Tan, B.T.G. 
Issue Date: Sep-1996
Citation: Chen, L., Ong, C.K., Tan, B.T.G. (1996-09). A resonant cavity for high-accuracy measurement of microwave dielectric properties. Measurement Science and Technology 7 (9) : 1255-1259. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/9/010
Abstract: This paper demonstrates that, along with the change in resonant frequency, the coupling coefficient between a resonant cavity and a transmission line will be altered once a dielectric sample is inserted into the cavity. These changes affect the measurements of the Q factors, and thus cause uncertainties in the permittivity measurements of dielectric samples. An X-band TE112 mode cavity is designed to overcome the uncertainties in the permittivity measurements, with which the Q values can be measured at the same resonant frequency and the same coupling conditions before and after the introduction of a dielectric sample.
Source Title: Measurement Science and Technology
URI: http://scholarbank.nus.edu.sg/handle/10635/95678
ISSN: 09570233
DOI: 10.1088/0957-0233/7/9/010
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