1. ScholarBank@NUS

Chan Siu Hung,Daniel

rp07001

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Author:  Chan, D.S.H.

Results 181-200 of 269 (Search time: 0.013 seconds).

Issue DateTitleAuthor(s)
1812-Jan-2007Nonvolatile polymer memory device based on bistable electrical switching in a thin film of poly(N-vinylcarbazole) with covalently bonded C60Ling, Q.-D. ; Lim, S.-L.; Song, Y.; Zhu, C.-X. ; Chan, D.S.-H. ; Kang, E.-T. ; Neoh, K.-G. 
1822009Omega-gate p-MOSFET with nanowirelike SiGe/Si core/shell channelJiang, Y.; Singh, N.; Liow, T.Y.; Lim, P.C.; Tripathy, S.; Lo, G.Q.; Chan, D.S.H. ; Kwong, D.-L.
183Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
184Feb-2010Origin of different dependences of open-circuit voltage on the electrodes in layered and bulk heterojunction organic photovoltaic cellsZhang, C. ; Tong, S.-W. ; Jiang, C.-Y.; Kang, E.-T. ; Chan, D.S.H. ; Zhu, C. 
1852008Performance breakthrough in 8 nm gate length gate-all-around nanowire transistors using metallic nanowire contactsJiang, Y.; Liow, T.Y.; Singh, N.; Tan, L.H.; Lo, G.Q.; Chan, D.S.H. ; Kwong, D.L.
1862009Performance improvement in charge-trap flash memory using lanthanum-based high-κ blocking oxideHe, W. ; Pu, J. ; Chan, D.S.H. ; Cho, B.J.
1871999Performance spread optimization of MOS VLSI circuit by statistical parameter designChen, H.M.; Samudra, G.S. ; Chan, D.S.H. ; Ibrahim, Y. 
188Jun-2006Physical and electrical characteristics of high-κ gate dielectric Hf(1-x)LaxOyWang, X.P.; Li, M.F. ; Chin, A. ; Zhu, C.X. ; Shao, J.; Lu, W.; Shen, X.C.; Yu, X.F.; Chi, R.; Shen, C.; Huan, A.C.H.; Pan, J.S.; Du, A.Y.; Lo, P.; Chan, D.S.H. ; Kwong, D.-L. 
18915-Aug-2005Physical and electrical properties of lanthanide-incorporated tantalum nitride for n -channel metal-oxide-semiconductor field-effect transistorsRen, C.; Chan, D.S.H. ; Wang, X.P.; Faizhal, B.B.; Li, M.-F. ; Yeo, Y.-C. ; Trigg, A.D.; Agarwal, A.; Balasubramanian, N.; Pan, J.S.; Lim, P.C.; Huan, A.C.H.; Kwong, D.-L.
19028-Feb-2005Physical model for frequency-dependent dynamic charge trapping in metal-oxide-semiconductor field effect transistors with HfO 2 gate dielectricShen, C.; Li, M.F. ; Yu, H.Y. ; Wang, X.P.; Yeo, Y.-C. ; Chan, D.S.H. ; Kwong, D.-L.
191Oct-2008Polymer electronic memories: Materials, devices and mechanismsLing, Q.-D. ; Liaw, D.-J.; Zhu, C. ; Chan, D.S.-H. ; Kang, E.-T. ; Neoh, K.-G. 
192Oct-2008Polymer electronic memories: Materials, devices and mechanismsLing, Q.-D. ; Liaw, D.-J.; Zhu, C. ; Chan, D.S.-H. ; Kang, E.-T. ; Neoh, K.-G. 
19324-Aug-2007Polymer memories: Bistable electrical switching and device performanceLing, Q.-D. ; Liaw, D.-J.; Teo, E.Y.-H. ; Zhu, C. ; Chan, D.S.-H. ; Kang, E.-T. ; Neoh, K.-G. 
19424-Aug-2007Polymer memories: Bistable electrical switching and device performanceLing, Q.-D. ; Liaw, D.-J.; Teo, E.Y.-H. ; Zhu, C. ; Chan, D.S.-H. ; Kang, E.-T. ; Neoh, K.-G. 
1952008Process and material properties of HfLaOx prepared by atomic layer depositionHe, W. ; Chan, D.S.H. ; Kim, S.-J.; Kim, Y.-S.; Kim, S.-T.; Cho, B.J.
19621-Jul-1999Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrateLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
1975-Oct-1999Pulse laser induced removal of mold flash on integrated circuit packagesLU, YONG FENG ; CHAN, DANIEL SIU HUNG ; LOW, TECK SENG 
19829-Apr-2003Pulsed single contact optical beam induced current analysis of integrated circuitsMIN, CHIN JIANN; KOLACHINA, SIVARAMAKRISHNA; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
1991995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
2001995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.