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Chan Siu Hung,Daniel

rp07001

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Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Author:  Chan, D.S.H.

Results 121-140 of 269 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1211999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1221999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1233-Mar-1998Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingCHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU 
1242007Interface barrier abruptness and work function requirements for scaling Schottky source-drain MOS transistorsAgrawal, N.; Chen, J. ; Hui, Z.; Yeo, Y.-C. ; Lee, S. ; Chan, D.S.H. ; Li, M.-F. ; Samudra, G.S. 
125Mar-1994Investigation of capacitive coupling voltage contrast using a specimen charging modelSim, K. ; Chan, D. ; Phang, J. 
126Mar-1994Investigation of capacitive coupling voltage contrast using a specimen charging modelSim, K. ; Chan, D. ; Phang, J. 
127Dec-1993Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscopePey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Balk, L.J.; Jakubowicz, A.; Bresse, J.F.; Myhajlenko, S.
128Dec-1993Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscopePey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Balk, L.J.; Jakubowicz, A.; Bresse, J.F.; Myhajlenko, S.
129Jul-2004Investigation of etching properties of HfO based high-K dielectrics using inductively coupled plasmaChen, J. ; Yoo, W.J. ; Tan, Z.Y.L.; Wang, Y.; Chan, D.S.H. 
130Dec-1997Investigation of interface traps in LDD pMOST's by the DCIV methodJie, B.B.; Li, M.F. ; Lou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
131Dec-1997Investigation of interface traps in LDD pMOST's by the DCIV methodJie, B.B.; Li, M.F. ; Lou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
1322-Sep-1999Investigation of light emitting diodes using nuclear microprobesYang, C. ; Bettiol, A.; Jamieson, D.; Hua, X.; Phang, J.C.H. ; Chan, D.S.H. ; Watt, F. ; Osipowicz, T. 
133Apr-1994Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysisChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. 
134Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
135Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
1362006Investigation of wet etching properties and annealing effects of Hf-based high-k materialsChen, J. ; Jong Yoo, W. ; Chan, D.S.H. 
1371997Ion Beam Induced Charge imaging for the failure analysis of semiconductor devicesKolachina, S.; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Sanchez, J.L.; Watt, F. 
1382005Lanthanide-incorporated metal nitrides with tunable work function and good thermal stability for NMOS devicesRen, C.; Chan, D.S.H. ; Faizhal, B.B.; Li, M.-F. ; Yeo, Y.-C. ; Trigg, A.D.; Agarwal, A.; Balasubramanian, N.; Pan, J.S.; Lim, P.C.; Kwong, D.-L.
1391997Laser cleaning of microparticles - Theoretical prediction of threshold laser fluenceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
1401997Laser cleaning of microparticles - Theoretical prediction of threshold laser fluenceLu, Y.F. ; Song, W.D. ; Hong, M.H. ; Chan, D.S.H. ; Low, T.S.