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Sane, V.

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Full Name
Sane, V.
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Sane, V.
 
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Publications

Results 1-5 of 5 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
21995New type of local defects in very thin silicon dioxide films on arsenic-implanted p-type siliconLau, W.S. ; Pey, K.S.; Ng, W.T.; Sane, V. ; Heng, J.M.C.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Cronquist, B.; Lee, Bob
31995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
41995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
51995Two types of local oxide/substrate defects in very thin silicon dioxide films on siliconLau, W.S. ; Sane, V. ; Pey, K.S.; Cronquist, B.