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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

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Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 21-40 of 40 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
21Mar-2002Layer inversion of Ni(Pt)Si on mixed phase Si filmsLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Osipowicz, T. ; See, A.
226-Nov-2000Liquid-phase epitaxial growth of amorphous silicon during laser annealing of ultrashallow p+/n junctionsChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; Osipowicz, T. ; Seng, H.L. ; See, A.; Dai, J.-Y.
2318-May-2006Magnetic and transport properties of Ge : MMMn granular systemLi, H.; Wu, Y. ; Liu, T. ; Wang, S.; Guo, Z.; Osipowicz, T. 
24Mar-2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesLee, P.S.; Mangelinck, D.; Pey, K.L. ; Shen, Z.X. ; Ding, J. ; Osipowicz, T. ; See, A.
25Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
26Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
2720-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
282007Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETsLee, R.T.P. ; Liow, T.-Y.; Tan, K.-M.; Lim, A.E.-J.; Ho, C.-S.; Hoe, K.-M.; Lai, M.Y.; Osipowicz, T. ; Lo, G.-Q.; Samudra, G. ; Chi, D.-Z.; Yeo, Y.-C. 
292007Orders of magnitude reduction in threading dislocations in ZnO grown on facet-controlled GaNChua, S.J. ; Zhou, H.L.; Pan, H. ; Osipowicz, T. 
302008Performance enhancement schemes featuring lattice mismatched S/D stressors concurrently realized on CMOS platform: e-SiGeSn S/D for pFETs by Sn+ implant and SiC S/D for nFETs by C+ implantWang, G.H.; Toh, E.-H.; Wang, X.; Seng, D.H.L.; Tripathy, S.; Osipowicz, T. ; Tau, K.C.; Samudra, G. ; Yeo, Y.-C. 
31Nov-2001Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin filmsNatarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L. 
32Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
33May-2003Rutherford backscattering analysis of GaN decompositionChoi, H.W.; Cheong, M.G.; Rana, M.A.; Chua, S.J. ; Osipowicz, T. ; Pan, J.S.
34Jun-2003Stoichiometric and structural alterations in GaN thin films during anneallingRana, M.A.; Osipowicz, T. ; Choi, H.W.; Breese, M.B.H. ; Watt, F. ; Chua, S.J. 
352007Strained SiGeSn formed by Sn implant into SiGe and pulsed laser annealingWang, G.H.; Toh, E.-H.; Wang, X.; Tripathy, S.; Osipowicz, T. ; Chan, T.K. ; Hoe, K.-M.; Balakumar, S.; Lo, G.-Q.; Samudra, G. ; Yeo, Y.-C. 
362007Structural, magnetic, and transport investigations of CrTe clustering effect in (Zn,Cr)Te systemSreenivasan, M.G.; Teo, K.L. ; Cheng, X.Z.; Jalil, M.B.A.; Liew, T.; Chong, T.C.; Du, A.Y.; Chan, T.K. ; Osipowicz, T. 
37Dec-2002Surface analysis of GaN decompositionChoi, H.W.; Rana, M.A.; Chua, S.J. ; Osipowicz, T. ; Pan, J.S.
381999Thermal studies on stress-induced void-like defects in epitaxial-CoSi 2 formationHo, C.S.; Pey, K.L. ; Tung, C.H.; Tee, K.C.; Prasad, K.; Saigal, D.; Tan, J.J.L.; Wong, H.; Lee, K.H.; Osipowicz, T. ; Chua, S.J. ; Karunasiri, R.P.G. 
391996Unconnected junction contrast in ion beam induced charge microscopyKolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F. 
402003Yellow luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescenceTeo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.S.; Chua, S.J. ; Liu, Y.Y.