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Chan Siu Hung,Daniel

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Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Results 41-60 of 141 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
41Nov-1995Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam testerSim, K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
210-May-2004Effect of surface NH 3 anneal on the physical and electrical properties of HfO 2 films on Ge substrateWu, N.; Zhang, Q.; Zhu, C. ; Yeo, C.C.; Whang, S.J. ; Chan, D.S.H. ; Li, M.F. ; Cho, B.J. ; Chin, A.; Kwong, D.-L.; Du, A.Y.; Tung, C.H.; Balasubramanian, N.
32004Effects of Annealing and Ar Ion Bombardment on the Removal of HfO 2 Gate DielectricChen, J. ; Yoo, W.J. ; Chan, D.S.H. ; Kwong, D.-L.
4Jan-2006Effects of N2, O2, and Ar plasma treatments on the removal of crystallized HfO2 filmChen, J. ; Yoo, W.J. ; Chan, D.S.H. 
52006Effects of SiO2/Si3N4 hard masks on etching properties of metal gatesHwang, W.S.; Cho, B.-J. ; Chan, D.S.H. ; Bliznetsov, V.; Yoo, W.J.
62008Effects of volatility of etch by-products on surface roughness during etching of metal gates in Cl2Hwang, W.S.; Cho, B.-J. ; Chan, D.S.H. ; Lee, S.W.; Yoo, W.J.
72008Efficient multilayer organic solar cells using the optical interference peakZhang, C. ; Tong, S.W. ; Jiang, C.; Kang, E.T. ; Chan, D.S.H. ; Zhu, C. 
828-Jul-2009Electrical conductance tuning and bistable switching in poly(N-vinylcarbazole)-Carbon nanotube composite filmsLiu, G.; Ling, Q.-D.; Teo, E.Y.H. ; Zhu, C.-X. ; Chan, D.S.-H. ; Neoh, K.-G.; Kang, E.-T.
9Feb-2007Electrically bistable thin-film device based on PVK and GNPs polymer materialSong, Y.; Ling, Q.D. ; Lim, S.L.; Teo, E.Y.H. ; Tan, Y.P.; Li, L.; Kang, E.T. ; Chan, D.S.H. ; Zhu, C. 
101-Jan-1988ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.Chim, W.K. ; Low, T.S. ; Chan, D.S.H. ; Phang, J.C.H. 
1115-Aug-1998Electronic and optical properties of carbon nitride thin films synthesized by laser ablation under ion beam bombardmentLu, Y.F. ; Ren, Z.M.; Song, W.D. ; Chan, D.S.H. 
122009Enhancement in open circuit voltage induced by deep interface hole traps in polymer-fullerene bulk heterojunction solar cellsZhang, C. ; Tong, S.W. ; Zhu, C. ; Jiang, C.; Kang, E.T. ; Chan, D.S.H. 
13Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
14Oct-2004Evidence and understanding of ALD HfO2-Al2O3 laminate MIM capacitors outperforming sandwich counterpartsDing, S.-J. ; Hu, H.; Zhu, C. ; Li, M.F. ; Kim, S.J. ; Cho, B.J. ; Chan, D.S.H. ; Yu, M.B.; Du, A.Y.; Chin, A.; Kwong, D.-L.
15Sep-1987Experimentally observed deviations from the superposition principle in crystalline silicon solar cells at low illuminationsChan, D.S.H. ; Phang, J.C.H. ; Wong, H.W.
1615-Feb-1997Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithmChim, W.K. ; Leang, S.E.; Chan, D.S.H. 
17Mar-2004Fermi-Level Pinning Induced Thermal Instability in the Effective Work Function of TaN in TaN/SiO 2 Gate StackRen, C.; Yu, H.Y. ; Kang, J.F. ; Hou, Y.T. ; Li, M.-F. ; Wang, W.D.; Chan, D.S.H. ; Kwong, D.-L.
18Jul-2007Flicker noise and its degradation characteristics under electrical stress in MOSFETs with thin strained-Si/SiGe dual-quantum wellJiang, Y.; Loh, W.Y.; Chan, D.S.H. ; Xiong, Y.Z.; Ren, C.; Lim, Y.F.; Lo, G.Q.; Kwong, D.-L.
19Mar-1998Fluence dependence of IBIC collection efficiency of CMOS transistorsOsipowicz, T. ; Sanchez, J.L.; Orlic, I. ; Watt, F. ; Kolachina, S.; Chan, D.S.H. ; Phang, J.C.H. 
20Oct-2003Formation of hafnium-aluminum-oxide gate dielectric using single cocktail liquid source in MOCVD processJoo, M.S. ; Cho, B.J. ; Yeo, C.C.; Chan, D.S.H. ; Whoang, S.J.; Mathew, S.; Bera, L.K.; Balasubramanian, N.; Kwong, D.-L.