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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Results 81-100 of 169 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
811-Jul-2002Interfacial reactions of Ni on Si 1-xGe x (x=0.2,0.3) at low temperature by rapid thermal annealingZhao, H.B.; Pey, K.L. ; Choi, W.K. ; Chattopadhyay, S.; Fitzgerald, E.A.; Antoniadis, D.A.; Lee, P.S.
822010Interference lithographically defined and catalytically etched, large-area silicon nanocones from nanowiresDawood, M.K.; Liew, T.H. ; Lianto, P.; Hong, M.H. ; Tripathy, S.; Thong, J.T.L. ; Choi, W.K. 
832008Investigation of effect of germanium on the crystallization process of hafnium aluminum oxide matrixZheng, F.; Choi, W.K. ; Chew, H.G.; Chan, L.
8418-May-2001Investigation of Ge nanocrystal formation in SiO2-Ge-SiO2 sandwich structureChoi, W.K. ; Ng, V. ; Swee, V.S.L.; Ong, C.S.; Yu, M.B.; Rusli; Yoon, S.F.
8515-Apr-2004Investigation of thermal effect on electrical properties of Si 0.887Ge0.113 and Si0.887-yGe 0.113Cy filmsFeng, W.; Choi, W.K. 
8620-Mar-2002Investigation on oxide growth mechanism of PECVD silicon carbide filmsChoi, W.K. ; Leoy, C.C.; Lee, L.P.
8715-Mar-2000Investigations on the morphology of silicon surfaces anisotropically etched with TMAHThong, J.T.L. ; Bai, Y. ; Luo, P.; Choi, W.K. 
882002Length effects on the reliability of dual-damascene Cu interconnectsWei, F.; Gan, C.L.; Thompson, C.V.; Clement, J.J.; Hau-Riege, S.P.; Pey, K.L. ; Choi, W.K. ; Tay, H.L.; Yu, B.; Radhakrishnan, M.K.
891-Jan-1993Logarithmic time dependence of pMOSFET degradation observed from gate capacitanceLing, C.H. ; Yeow, Y.T.; Ah, L.K.; Yung, W.H.; Choi, W.K. 
902002Manipulation of germanium nanocrystals in a tri-layer insulator structure of a metal-insulator-semiconductor memory deviceTeo, L.W.; Heng, C.L. ; Ho, V.; Tay, M.; Choi, W.K. ; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
112003Material and electrical characterization of HfO2 films for MIM capacitors applicationHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
1210-Aug-1993Measurement of the current transient in Ta2O5 filmsSundaram, K.; Choi, W.K. ; Ling, C.H. 
11310-Oct-2013Mechanics of catalyst motion during metal assisted chemical etching of siliconLai, C.Q.; Cheng, H.; Choi, W.K. ; Thompson, C.V.
11415-Feb-2001Microstructural and photoluminescence studies of germanium nanocrystals in amorphous silicon oxide filmsChoi, W.K. ; Ho, Y.W.; Ng, S.P.; Ng, V. 
1151-Jan-2002Microstructural characterization of rf sputtered polycrystalline silicon germanium filmsChoi, W.K. ; Teh, L.K.; Bera, L.K. ; Chim, W.K. ; Wee, A.T.S. ; Jie, Y.X. 
1165-Apr-2011Mimicking both petal and lotus effects on a single silicon substrate by tuning the wettability of nanostructured surfacesDawood, M.K.; Zheng, H.; Liew, T.H. ; Leong, K.C.; Foo, Y.L.; Rajagopalan, R. ; Khan, S.A. ; Choi, W.K. 
11731-May-2004Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectricNg, T.H.; Chim, W.K. ; Choi, W.K. ; Ho, V.; Teo, L.W.; Du, A.Y.; Tung, C.H.
1187-Apr-2012Modulation of surface wettability of superhydrophobic substrates using Si nanowire arrays and capillary-force-induced nanocohesionDawood, M.K.; Zheng, H.; Kurniawan, N.A.; Leong, K.C.; Foo, Y.L.; Rajagopalan, R. ; Khan, S.A. ; Choi, W.K. 
119Oct-2003Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy MeasurementsChim, W.K. ; Wong, K.M. ; Yeow, Y.T.; Hong, Y.D.; Lei, Y. ; Teo, L.W.; Choi, W.K. 
1202004Mortality dependence of Cu dual damascene interconnects on adjacent segmentChang, C.W.; Gan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Hwang, N.