Full Name
Jie Yaxiong
(not current staff)
Jie, Y.
Jie, Y.X.
Main Affiliation


Results 1-9 of 9 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
111-Dec-2000Dynamics of optical nonlinearity of Ge nanocrystals in a silica matrixJie, Y.X. ; Xiong, Y.N.; Wee, A.T.S. ; Huan, C.H.A. ; Ji, W. 
26-Aug-2001Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopyNi, H.Q.; Lu, Y.F. ; Liu, Z.Y.; Qiu, H.; Wang, W.J. ; Ren, Z.M.; Chow, S.K.; Jie, Y.X. 
31-Jan-2002Microstructural characterization of rf sputtered polycrystalline silicon germanium filmsChoi, W.K. ; Teh, L.K.; Bera, L.K. ; Chim, W.K. ; Wee, A.T.S. ; Jie, Y.X. 
42001Nonlinear optical response of Ge nanocrystals in silica matrix with excitation of femtosecond pulsesLi, H.P.; Kam, C.H.; Lam, Y.L.; Jie, Y.X. ; Ji, W. ; Wee, A.T.S. ; Huan, C.H.A. 
51-Feb-2011Phonon confinement in Ge nanocrystals in silicon oxide matrixJie, Y. ; Wee, A.T.S. ; Huan, C.H.A.; Shen, Z.X.; Choi, W.K. 
625-Feb-2004Raman and photoluminescence properties of Ge nanocrystals in silicon oxide matrixJie, Y.X. ; Wee, A.T.S. ; Huan, C.H.A. ; Sun, W.X. ; Shen, Z.X. ; Chua, S.J. 
72000Raman shift and broadening in stress-minimized Ge nanocrystals in silicon oxide matrixJie, Y.X. ; Huan, Cha ; Wee, A.T.S. ; Shen, Z.X. 
81999Surface and optical properties of nanocrystalline GaN thin films on sapphire (0001) by pulsed laser depositionNi, H.Q.; Lu, Y.F. ; Teng, J.H.; Jie, Y.X. ; Mai, Z.H.; Ren, Z.M.
91999Synthesis and characterization of Ge nanocrystals immersed in amorphous SiOx matrixJie, Y.X. ; Wu, X. ; Huan, C.H.A. ; Wee, A.T.S. ; Guo, Y. ; Zhang, T.J.; Pan, J.S. ; Chai, J.; Chua, S.J.