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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Results 41-60 of 169 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
41Sep-1997Electrical characterisation of metal-thin oxide-silicon tunnel diodes prepared by rapid thermal annealingChoi, W.K. ; Poon, F.W.
421999Electrical characterisation of RF sputtered tantalum oxide films rapid thermal annealed with Ar, N2, O2 and N2OChoi, W.K. ; Tan, L.S. ; Lim, J.Y.; Pek, S.G.
3Apr-2003Electrical characterization of a trilayer germanium nanocrystal memory deviceHo, V.; Tay, M.S.; Moey, C.H.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Heng, C.L.; Lei, Y.
410-May-2006Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contactsJin, L.J.; Pey, K.L.; Choi, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.; Chi, D.Z.
51-Jan-1997Electrical characterization of radio frequency sputtered hydrogenated amorphous silicon carbide filmsChoi, W.K. ; Han, L.J.; Loo, F.L.
615-Nov-1996Electrical characterization of rapid thermal annealed radio frequency sputtered silicon oxide filmsChoi, W.K. ; Choo, C.K.; Lu, Y.F. 
7Mar-2001Electrical properties of crystalline YSZ films on silicon as alternative gate dielectricsWang, S.J. ; Ong, C.K. ; Xu, S.Y. ; Chen, P. ; Tjiu, W.C.; Huan, A.C.H.; Yoo, W.J. ; Lim, J.S.; Feng, W.; Choi, W.K. 
810-Jul-2000Electrical properties of rapid thermal oxides on Si1-x-yGexCy filmsBera, L.K. ; Choi, W.K. ; Feng, W.; Yang, C.Y.; Mi, J.
91-May-2006Electromigration resistance in a short three-contact interconnect treeChang, C.W.; Choi, Z.-S.; Thompson, C.V.; Gan, C.L.; Pey, K.L.; Choi, W.K. ; Hwang, N.
10Jan-2001Evolution of hillocks during silicon etching in TMAHThong, J.T.L. ; Luo, P.; Choi, W.K. ; Tan, S.C.
1115-Jul-2003Experimental characterization and modeling of the reliability of three-terminal dual-damascene Cu interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. 
122002Experimental characterization of the reliability of 3-terminal dual-damascene copper interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L. ; Choi, W.K. ; Wei, F.; Yu, B.; Hau-Riege, S.P.
132003Experimental characterization of the reliability of multi-terminal dual-damascene copper interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Chang, C.W.; Guo, Q.
14Nov-2000Experimental investigation of flow friction for liquid flow in microchannelsXu, B.; Ooi, K.T.; Wong, N.T.; Choi, W.K. 
15May-1995Exploratory observations of effect of rapid thermal processing on silicon minority carrier lifetime using laser microwave photoconductance methodChoi, W.K. ; Ah, L.K.; Chan, Y.M.; Raman, A. 
16Sep-2004Fabrication and characterization of a trilayer germanium nanocrystal memory device with hafnium dioxide as the tunnel dielectricNg, T.H.; Ho, V.; Teo, L.W.; Tay, M.S.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Du, A.Y.; Tung, C.H.
17Aug-2006Fabrication of germanium nanowires by oblique angle depositionChew, H.G.; Choi, W.K. ; Chim, W.K.; Fitzgerald, E.A.
18Aug-2013Fabrication of nanostructures on polyethylene terephthalate substrate by interference lithography and plasma etchingZhu, M.; Li, B.; Choi, W.K. 
192001Factors affecting Ge nanocrystal size in co-sputtered Ge+SiO2 filmsChoi, W.K. ; Ng, V. ; Ho, Y.W.; Chen, T.B.; Ho, V.
20Apr-2010Field emission from a large area of vertically-aligned carbon nanofibers with nanoscale tips and controlled spatial geometryYun, J.; Wang, R.; Choi, W.K. ; Thong, J.T.L. ; Thompson, C.V.; Zhu, M.; Foo, Y.L.; Hong, M.H.