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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Department:  ELECTRICAL & COMPUTER ENGINEERING

Results 1-20 of 76 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
1Jun-2013A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscopeChen, R.; Agarwal, K. ; Sheppard, C.J.R.; Phang, J.C.H. ; Chen, X. 
22007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
32004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
42005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
52009Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion MicroscopyTiedemann, A.-K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
62005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
7Sep-2001Analysis of high-power devices using proton beam induced charge microscopyZmeck, M.; Phang, J. ; Bettiol, A. ; Osipowicz, T. ; Watt, F. ; Balk, L.; Niedernostheide, F.-J.; Schulze, H.-J.; Falck, E.; Barthelmess, R.
82005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
92009Applications of scanning near-field photon emission microscopyIsakov, D.V.; Tan, B.W.M.; Phang, J.C.H. ; Yeo, Y.C. ; Tio, A.A.B.; Zhang, Y.; Geinzer, T.; Balk, L.J.
102008Applications of scanning Near-field photon emission microscopyIsakov, D.; Tan, B.; Phang, J. ; Yeo, Y. ; Tio, A.; Zhang, Y.; Geinzer, T.; Balk, L.
112002Automatic integrated circuit die positioning in the scanning electron microscopeTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
122011Backside reflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
13Jun-2007Characterization of electronic materials and devices by scanning near-field microscopyBalk, L.J.; Heiderhoff, R.; Phang, J.C.H. ; Thomas, Ch.
142011Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning techniqueMeng, L.; Steen, S.; Koo, C.K. ; Bhatia, C.S. ; Street, A.G.; Joshi, P.; Kim, Y.H.; Phang, J.C.H. 
152004Characterization of interconnect defects using scanning thermal conductivity microscopyHo, H.W.; Phang, J.C.H. ; Altes, A.; Balk, L.J.
162001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
172011Characterization of MOS transistors using dynamic backside reflectance modulation techniqueTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
182008Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessorsQuah, A.C.T.; Goh, S.H.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
192010Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysisGoh, S.H.; Quah, A.C.T.; Ravikumar, V.K.; Phoa, S.L.; Narang, V.; Chin, J.M.; Chua, C.M.; Phang, J.C.H. 
20Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W.