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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 101-120 of 151 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1012007Localization of Cu/low-k interconnect reliability defects by pulsed laser induced techniqueTan, T.L.; Quah, A.C.T.; Gan, C.L.; Phang, J.C.H. ; Chua, C.M.; Ng, C.M.; Du, A.-Y.
10223-Jan-1996Method and apparatus for measuring quantitative voltage contrastCHIM, WAI K. ; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
103Oct-2004Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror opticsChan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V.
1041997Miniature scanning electron microscope design based upon the use of permanent magnetsKhursheed, A. ; Thong, J.T.L. ; Phang, J.C.H. ; Ong, I.P.
1052010Mobile diffractive solid immersion lens design for backside laser based fault localizationGoh, S.H.; Cho, J.Y.; Lam, J.; Phang, J.C.H. 
106Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
7Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
829-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
9Aug-2008Near-field detection of photon emission from silicon with 30 nm spatial resolutionIsakov, D.; Tio, A.A.B.; Geinzer, T.; Phang, J.C.H. ; Zhang, Y.; Balk, L.J.
102008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
112007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
127-Jul-2011Negative backside thermoreflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
131985NEW CURVE FITTING ERROR CRITERION FOR SOLAR CELL I-V CHARACTERISTICS.Phang, Jacob C.H. ; Chan, Daniel S.H. 
14Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
151993New low-voltage contrast mechanism to image local defects in very thin silicon dioxide films. True oxide electron beam induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
161997New method for the localization of metallization defects using cathodoluminescence imagingLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
172001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.
181995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
191995New type of local defects in very thin silicon dioxide films on arsenic-implanted p-type siliconLau, W.S. ; Pey, K.S.; Ng, W.T.; Sane, V. ; Heng, J.M.C.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Cronquist, B.; Lee, Bob
202013Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Papa Rao, S.S.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H.