1. ScholarBank@NUS

Osipowicz Thomas

rp05639

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 101-120 of 184 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1012-Apr-1999Micro-PIXE and channeling PIXE analysis of Ag-doped YBa2Cu3O7-δ thin filmsOsipowicz, T. ; Xu, X.Y.; Yang, C. ; Zhou, W.Z.; Ong, C.K. ; Watt, F. 
2Mar-2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesLee, P.S.; Mangelinck, D.; Pey, K.L. ; Shen, Z.X. ; Ding, J. ; Osipowicz, T. ; See, A.
3Jul-2001Micro-RBS study of nickel silicide formationSeng, H.L. ; Osipowicz, T. ; Lee, P.S.; Mangelinck, D.; Sum, T.C. ; Watt, F. 
4Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F. 
51999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
614-May-1998MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
725-Aug-1999MICROMACHINING USING HIGH ENERGY LIGHT IONSWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
824-Sep-2002Micromachining using high energy light ionsWATT, FRANK ; SPRINGHAM, STUART VICTOR; OSIPOWICZ, THOMAS ; BREESE, MARK 
9Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
103-May-2007Morphology controllable ZnO growth on facet-controlled epitaxial lateral overgrown GaN/sapphire templatesZhou, H.L.; Chua, S.J.; Pan, H. ; Zhu, Y.W. ; Osipowicz, T. ; Liu, W.; Zang, K.Y.; Feng, Y.P. ; Sow, C.H. 
11Jul-2007Nano-imaging of single cells using STIMMinqin, R. ; van Kan, J.A. ; Bettiol, A.A. ; Daina, L.; Gek, C.Y.; Huat, B.B.; Whitlow, H.J.; Osipowicz, T. ; Watt, F. 
1216-Jul-2009Nanoflake CoN as a high capacity anode for Li-ion batteriesDas, B.; Reddy, M.V. ; Malar, P. ; Osipowicz, T. ; Subba Rao, G.V. ; Chowdari, B.V.R. 
13Feb-1996New developments in beam induced current methods for the failure analysis of VLSI circuitsChan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F. 
1420-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
152007Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETsLee, R.T.P. ; Liow, T.-Y.; Tan, K.-M.; Lim, A.E.-J.; Ho, C.-S.; Hoe, K.-M.; Lai, M.Y.; Osipowicz, T. ; Lo, G.-Q.; Samudra, G. ; Chi, D.-Z.; Yeo, Y.-C. 
16Mar-1998Nuclear microprobe analysis and imaging: Current state of the art performancesWatt, F. ; Osipowicz, T. ; Choo, T.F.; Orlic, I. ; Tang, S.M. 
172-Sep-1995Nuclear microscopy of rubies: trace elements and inclusionsOsipowicz, T. ; Tay, T.S.; Orlic, I. ; Tang, S.M. ; Watt, F. 
18Feb-2013Objective improvement of the visual quality of ion microscope imagesNorarat, R.; Whitlow, H.J.; Ren, M. ; Osipowicz, T. ; Van Kan, J.A. ; Timonen, J.; Watt, F. 
192005Observation of a new kinetics to form Ni3Si2 and Ni31Si12 suicides at low temperature (200°C)Rahman, Md..A.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
20Nov-2005Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S.