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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 21-40 of 151 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
212000Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure AnalysisPalaniappan, M. ; Chin, J.M.; Phang, J.C.H. ; Chan, D.S.H. ; Soh, C.E.; Gilfeather, G.
222009Applications of scanning near-field photon emission microscopyIsakov, D.V.; Tan, B.W.M.; Phang, J.C.H. ; Yeo, Y.C. ; Tio, A.A.B.; Zhang, Y.; Geinzer, T.; Balk, L.J.
232008Applications of scanning Near-field photon emission microscopyIsakov, D.; Tan, B.; Phang, J. ; Yeo, Y. ; Tio, A.; Zhang, Y.; Geinzer, T.; Balk, L.
241999Automatic DRAM cell location in the SEMThong, J.T.L. ; Zhu, Y. ; Phang, J.C.H. 
252000Automatic IC Die Positioning in the SEMTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
262002Automatic integrated circuit die positioning in the scanning electron microscopeTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
272011Backside reflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
281-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
291995Cathodoluminescence contrast of localized defects part I. Numerical model for simulationPey, K.L. ; Chan, D.S.H. ; Phang, J.C.H. ; Breese, J.F.; Myhajlenko, S.
301995Cathodoluminescence contrast of localized defects part II. Defect investigationPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Breeze, J.F.; Myhajlenko, S.
315-Mar-1997Cathodoluminescence detectorPHANG, JACOB CHEE HONG ; CHAN, DANIEL SIU HUNG ; PEY, KIN LEONG 
3225-May-1994Cathodoluminescence detectorPHANG, JACOB CHEE HONG ; CHAN, DANIEL SIU HUNG; PEY, KIN LEONG
331997Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structuresLiu, X.; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
341998Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiencyPhang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X.
35Jun-2007Characterization of electronic materials and devices by scanning near-field microscopyBalk, L.J.; Heiderhoff, R.; Phang, J.C.H. ; Thomas, Ch.
362011Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning techniqueMeng, L.; Steen, S.; Koo, C.K. ; Bhatia, C.S. ; Street, A.G.; Joshi, P.; Kim, Y.H.; Phang, J.C.H. 
172004Characterization of interconnect defects using scanning thermal conductivity microscopyHo, H.W.; Phang, J.C.H. ; Altes, A.; Balk, L.J.
182001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
192011Characterization of MOS transistors using dynamic backside reflectance modulation techniqueTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
201995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L.