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Chan Siu Hung,Daniel

rp07001

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Full Name
Chan Siu Hung,Daniel
(not current staff)
Variants
Chan, Daniel S.H.
CHAN, DANIEL S. H.
Chan, D.S.-H.
Chan, D.S.H.
CHAN SIU HUNG DANIEL
CHAN, DANIEL SIU HUNG
Daniel Chan, S.H.
Chan, D.
CHAN, D. S. H.
 
Main Affiliation
 
Faculty
 
Email
elecshd@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Author:  Chan, D.S.H.
Department:  ELECTRICAL ENGINEERING
Date Issued:  [1990 TO 1999]

Results 1-20 of 116 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
11-Oct-1997A cleaning model for removal of particles due to laser-induced thermal expansion of substrate surfaceLu, Y.-F. ; Song, W.-D. ; Ye, K.-D. ; Lee, Y.-P.; Chan, D.S.H. ; Low, T.-S. 
21994A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scanOng, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
3Jul-1997A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junction MOSFET'sLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
4Oct-1995A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETsLeang, S.E.; Chim, W.K. ; Chan, D.S.H. 
5Sep-1993A simulation model for electron irradiation induced specimen charging in a scanning electron microscopeChan, D.S.H. ; Sim, K.S. ; Phang, J.C.H. ; Balk, L.J.; Uchikawa, Y.; Hasselbach, F.; Dinnis, A.R.
61-Nov-1998A theoretical model for laser cleaning of microparticles in a thin liquid layerLu, Y.-F. ; Zhang, Y.; Song, W.-D. ; Chan, D.S.H. 
71997A theoretical model for laser removal of particles from solid surfacesLu, Y.F. ; Song, W.D. ; Ang, B.W.; Hong, M.H. ; Chan, D.S.H. ; Low, T.S. 
8Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
91999An improved drain-current-conductance method with substrate back-biasingTan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
101997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
111998Automatic control and real-time monitoring of laser cleaning and laser ablationLu, Y.F. ; Meng, M.; Hong, M.H. ; Low, T.S. ; Chan, D.S.H. 
12Jan-1999Carbon nitride thin films deposited by nitrogen-ion-assisted KRF excimer ablation of graphiteFeng, L.Y. ; Min, R.Z.; Qiao, N.H.; Feng, H.Z.; Chan, D.S.H. ; Seng, L.T. ; Yin, C.S.; Gamani, K. ; Geng, C. ; Kun, L.
131995Cathodoluminescence contrast of localized defects part I. Numerical model for simulationPey, K.L. ; Chan, D.S.H. ; Phang, J.C.H. ; Breese, J.F.; Myhajlenko, S.
141995Cathodoluminescence contrast of localized defects part II. Defect investigationPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Breeze, J.F.; Myhajlenko, S.
155-Mar-1997Cathodoluminescence detectorPHANG, JACOB CHEE HONG ; CHAN, DANIEL SIU HUNG ; PEY, KIN LEONG 
161997Cathodoluminescence evaluation of electrical stress condition of Si-SiO2 structuresLiu, X.; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
171998Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiencyPhang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X.
181999Channel-width effect on hot-carrier degradation in NMOSFETs with recessed-LOCOS isolation structuresYue, J.M.P.; Chim, W.K. ; Cho, B.J. ; Chan, D.S.H. ; Qin, W.H.; Kim, Y.B.; Jang, S.A.; Yeo, I.S.
191995Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement techniqueLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
201997Characterization of the plasma-induced effective mobility degradation of LATID NMOSFETsLou, C.L.; Song, J.; Tan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.