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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 41-60 of 184 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
411-Aug-2020Dosimetric uncertainties impact on cell survival curve with low energy protonHong Qi Tan; Wei Yang Calvin Koh; Eugenia Li Ling Yeo ; Khong Wei Ang; Dennis Jun Jie Poon; Chu Pek Lim ; Saumitra K. Vjandar; Ce-Belle Chen ; Minqin Ren ; Thomas Osipowicz ; Khe Che Soo; Melvin Lee Kiang Chua ; Sung Yong Park 
4215-Feb-2002Effect of a titanium cap in reducing interfacial oxides in the formation of nickel silicideTan, W.L.; Pey, K.L. ; Chooi, S.Y.M.; Ye, J.H.; Osipowicz, T. 
43Mar-2003Effect of exposure to air on sheet resistance and phase composition of Co silicides annealed at a low temperature of 470°CHuang, Q.; Tan, A.S.; Tan, J.M.; Goh, I.S.; Dong, Z.Z.; Ong, C.K. ; Osipowicz, T. 
44Apr-2008Effect of ion beam irradiation on magnetic and structural properties of Pt/Cr/Co multilayersTripathi, J.K.; Kumar, D.; Malar, P. ; Osipowicz, T. ; Ganesan, V.; Gupta, A.; Som, T.
5Sep-2002Effect of ion implantation on layer inversion of Ni silicided poly-SiLee, P.S.; Pey, K.L. ; Mangelinck, D.; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; Chan, L.
62007Effect of low fluence laser annealing on ultrathin Lu2 O3 high- k dielectricDarmawan, P.; Lee, P.S.; Setiawan, Y.; Ma, J.; Osipowicz, T. 
71-Aug-2005Effect of Pt on agglomeration and Ge out diffusion in Ni(Pt) germanosilicideJin, L.J.; Pey, K.L.; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.; Rahman, Md.A.; Osipowicz, T. ; Tung, C.H.
8Jun-2001Effect of radio-frequency bias voltage on the optical and structural properties of hydrogenated amorphous silicon carbideCui, J.; Rusli; Yoon, S.F.; Teo, E.J. ; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Osipowicz, T. ; Watt, F. 
97-Mar-2002Effect of the silicon nitride passivation layer on the Cu/Ta/SiO2/Si multi-layer structureLatt, K.M.; Park, H.S.; Seng, H.L. ; Osipowicz, T. ; Lee, Y.K.; Li, S.
10Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
111-Mar-2001Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor depositionCui, J.; Rusli, R.; Yoon, S.F.; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
12Aug-2005Effects of prolonged annealing on NiSi at low temperature (500°C)Anisur, M.R.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
131-Aug-2004Enhanced low field magnetoresistance of Al2O3-La 0.7Sr0.3MnO3 composite thin films via a pulsed laser depositionYan, L. ; Kong, L.B. ; Yang, T.; Goh, W.C. ; Tan, C.Y. ; Ong, C.K. ; Rahman, Md.A.; Osipowicz, T. ; Ren, M.Q. 
143-Sep-2004Enhanced planar channeling of MeV protons through thin crystalsBreese, M.B.H. ; Rana, M.A.; Osipowicz, T. ; Teo, E.J. 
15Jan-2002Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stackLee, P.S.; Mangelinck, D.; Pey, K.L. ; Ding, J. ; Chi, D.Z.; Osipowicz, T. ; Dai, J.Y.; See, A.
1615-Mar-2004Epitaxial growth of co-doped Eu and Sm in α-Zn0.05Sr 0.95S on (0 0 1)MgO substrate using α-MnS buffer layerChen, C.; Teo, K.L. ; Chong, T.C. ; Wu, Y.H. ; Osipowicz, T. ; Anisur Rahman, Md.
17Apr-2005Fabrication of a free standing resolution standard for focusing MeV ion beams to sub 30 nm dimensionsVan Kan, J.A. ; Shao, P.G. ; Molter, P.; Saumer, M.; Bettiol, A.A. ; Osipowicz, T. ; Watt, F. 
182008Figures of merit for focusing mega-electron-volt ion beams in biomedical imaging and proton beam writingRen, M. ; Whitlow, H.J.; Sagari A. R., A.; Van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
19Mar-1998Fluence dependence of IBIC collection efficiency of CMOS transistorsOsipowicz, T. ; Sanchez, J.L.; Orlic, I. ; Watt, F. ; Kolachina, S.; Chan, D.S.H. ; Phang, J.C.H. 
201999Formation and stability of Ni(Pt) silicide on(100)Si and (111)SiMangelinck, D.; Dai, J.Y.; Lahiri, S.K.; Ho, C.S.; Osipowicz, T.