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Chunxiang Zhu

rp01634

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Full Name
Chunxiang Zhu
Variants
Zhu, C.-X.
Zhu, C.X.
ZHU, CHUNXIANG
Zhu Chunxiang
Zhu, C.
 
Main Affiliation
 
Faculty
 
Email
elezhucx@nus.edu.sg
 

Publications

Results 101-120 of 143 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1012007On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stackSamanta, P.; Zhu, C. ; Chan, M.
102Feb-2010Origin of different dependences of open-circuit voltage on the electrodes in layered and bulk heterojunction organic photovoltaic cellsZhang, C. ; Tong, S.-W. ; Jiang, C.-Y.; Kang, E.-T. ; Chan, D.S.H. ; Zhu, C. 
1032010Palladium-induced crystallization of germanium with varied palladium thicknessesPhung, T.H.; Zhu, C. 
1042009Palladium-induced lateral crystallization of amorphous-germanium thin film on insulating substrateXie, R.; Phung, T.H.; Yu, M.; Oh, S.A.; Tripathy, S.; Zhu, C. 
105Oct-2009Performance Improvement of Sm2O3 MIM capacitors by using plasma treatment after dielectric formationYang, J.-J.; Chen, J.-D. ; Wise, R.; Yeo, Y.-C. ; Zhu, C. 
106Jun-2006Physical and electrical characteristics of high-κ gate dielectric Hf(1-x)LaxOyWang, X.P.; Li, M.F. ; Chin, A. ; Zhu, C.X. ; Shao, J.; Lu, W.; Shen, X.C.; Yu, X.F.; Chi, R.; Shen, C.; Huan, A.C.H.; Pan, J.S.; Du, A.Y.; Lo, P.; Chan, D.S.H. ; Kwong, D.-L. 
1071-Jul-2003Physical and electrical characterization of HfO2 metal-insulator-metal capacitors for Si analog circuit applicationsHu, H.; Zhu, C. ; Lu, Y.F. ; Wu, Y.H. ; Liew, T. ; Li, M.F. ; Cho, B.J. ; Choi, W.K. ; Yakovlev, N.
1082009Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applicationsChen, J.-D. ; Yang, J.-J.; Wise, R.; Steinmann, P.; Yu, M.-B.; Zhu, C. ; Yeo, Y.-C. 
1092009Polycrystalline Si nanowire SONOS nonvolatile memory cell fabricated on a gate-all-around (GAA) channel architectureFu, J.; Jiang, Y.; Singh, N.; Zhu, C.X. ; Lo, G.Q.; Kwong, D.L.
1109-Sep-2010Preparation and memory performance of a nanoaggregated dispersed red 1-functionalized poly (N-vinylcarbazole) film via solution-phase self-assemblyZhuang, X.-D.; Chen, Y.; Liu, G. ; Zhang, B.; Neoh, K.-G. ; Kang, E.-T. ; Zhu, C.-X. ; Li, Y.-X.; Niu, L.-J.
11115-Jan-2012Push-Pull archetype of reduced graphene oxide functionalized with polyfluorene for nonvolatile rewritable memoryZhang, B.; Chen, Y.; Liu, G. ; Xu, L.-Q.; Chen, J.; Zhu, C.-X. ; Neoh, K.-G. ; Kang, E.-T. 
112Jun-2003PVD HfO2 for high-precision MIM capacitor applicationsKim, S.J. ; Cho, B.J. ; Li, M.F. ; Yu, X.; Zhu, C. ; Chin, A.; Kwong, D.-L.
113Jun-2004RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applicationsDing, S.-J. ; Hu, H.; Zhu, C. ; Kim, S.J. ; Yu, X.; Li, M.-F. ; Cho, B.J. ; Chan, D.S.H. ; Yu, M.B.; Rustagi, S.C.; Chin, A.; Kwong, D.-L.
114May-2008Si-nanowire based gate-all-around nonvolatile SONOS memory cellFu, J.; Singh, N.; Buddharaju, K.D.; Teo, S.H.G.; Shen, C.; Jiang, Y.; Zhu, C.X. ; Yu, M.B.; Lo, G.Q.; Balasubramanian, N.; Kwong, D.L.; Gnani, E.; Baccarani, G.
1152008Simple tandem organic photovoltaic cells for improved energy conversion efficiencyZhang, C. ; Tong, S.W. ; Jiang, C.; Kang, E.T. ; Chan, D.S.H. ; Zhu, C. 
1162015Solution processed F doped ZnO (ZnO:F) for thin film transistors and improved stability through co-doping with alkali metalsChang Jingjing; Lin Zhenhua ; Lin Ming; Zhu Chunxiang ; Zhang Jie; Wu Jishan 
11724-Jul-2013Solution-processed lif-doped ZnO films for high performance low temperature field effect transistors and inverted solar cellsChang, J.; Lin, Z.; Zhu, C. ; Chi, C. ; Zhang, J.; Wu, J. 
118Dec-2011Some issues in advanced CMOS gate stack performance and reliabilityLi, M.-F. ; Wang, X.P.; Shen, C.; Yang, J.J.; Chen, J.D. ; Yu, H.Y.; Zhu, C. ; Huang, D.
1191-Dec-2008Spatially well-defined binary brushes of poly(ethylene glycol)s for micropatterning of active proteins on anti-fouling surfacesXu, F.J. ; Li, H.Z.; Li, J. ; Teo, Y.H.E. ; Zhu, C.X. ; Kang, E.T. ; Neoh, K.G. 
1202007Spectroscopic ellipsometry investigation of nickel germanide formationZhang, Q.; Han, C.W.; Zhu, C.